Patents by Inventor Patrick S. Rood

Patrick S. Rood has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7944561
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: May 17, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Patent number: 7940396
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: May 10, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Patent number: 5664252
    Abstract: To provide a standard for determining an objective level of performance of photographic film developer processes, a production sensitometer, of the type commonly used in the field, is correlated with a high precision, master sensitometer, defined as a standard. Relative exposure values are computed for each step of a step wedge exposed by a production sensitometer with reference to a corresponding step of a step wedge exposed in the master sensitometer. The relative exposure values are recorded and stored in a read-only memory in the production sensitometer. In the field, the steps of a step wedge on a test film strip exposed by the production sensitometer and developed by the developer processor to be tested, are read by a densitometer which uses the stored relative exposure values to compute density values for the test strip correlated to the master sensitometer. The developer processor may then be adjusted such that the developed film will match quality control parameters, e.g.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: September 2, 1997
    Assignee: X-Rite, Incorporated
    Inventors: Bernard J. Berg, Patrick S. Rood
  • Patent number: 5369481
    Abstract: A portable spectrophotometer includes a small-diameter optical sphere as well as optical detectors and signal processing and display circuitry which allows the instrument to be taken to an object to be measured and which provides a readout of color values at the portable instrument. The instrument is capable of providing specular-included and specular-excluded color readings simultaneously. The interior of the integrating sphere is coated with a highly reflective, color-absorbing material, and light from an incandescent lamp is diffused within the sphere prior to reaching the object to be measured. The sphere is provided with a first aperture which receives spectrally-included light and which is positioned to absorb a spectral component of the diffused source light. A second aperture positioned at a corresponding angular position with respect to the object measures specular-excluded light, excluding the specular component absorbed by the first aperture.
    Type: Grant
    Filed: May 8, 1992
    Date of Patent: November 29, 1994
    Assignee: X-Rite, Incorporated
    Inventors: Bernard J. Berg, Thomas J. Boes, Mark A. Cargill, Patrick S. Rood