Patents by Inventor Patrick Sandoz

Patrick Sandoz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring the location of an object by phase detection
    Publication number: 20050226533
    Abstract: A method for measuring the location of an object in an observed space by means of a fixed observation system connected to a processing unit for generation of an image comprising a pixel matrix, the object being provided with a test marker. The test marker comprises a periodic pattern in two dimensions and a digital processing of the image of the test marker is carried out to produce an image comprising a first grating and an image comprising a second grating which are analyzed digitally to calculate the position of the test marker within the matrix of pixels.
    Type: Application
    Filed: February 27, 2003
    Publication date: October 13, 2005
    Inventors: Patrick Sandoz, Philippe Humbert, Vincent Bonnans, Tijani Gharbi