Abstract: Embodiments of the present invention provide a contact chuck test head for a handler of an integrated circuit tester system. The contact chuck test head comprises a magnetically held DUT contact unit that can be replaced by a technician without requiring any tool or special equipment. The contact chuck test head t is mounted to an automated handler. Magnets are employed at an interface between the DUT contact unit and contact chuck base. This allows the DUT contact unit to be brought into close proximity to the contact chuck base portion and magnetic forces act to both align and mate the two parts together. Since the DUT contact unit requires change out to accommodate different sizes and types of DUTs, it is advantageous to provide an easy swap-out mechanism.

Abstract: Embodiments of the present invention provide a magnetically retained replaceable contact plate assembly. The magnetically retained replaceable contact plate assembly includes a contact chuck interface. The contact chuck is configured to physically mate with a device under test (DUT). The magnetically retained replaceable contact plate assembly also includes a DUT layout unit interface (DLU). The DLU is configured to couple to multiple magnetically retained replaceable contact plate assemblies and to a semiconductor handler unit. The DLU is configured to move DUTs within a test environment, and the magnetically retained replaceable contact plate assembly is configured to magnetically attach to said DLU.

Abstract: A magnetically retained replaceable and/or removable contact plate assembly includes a contact chuck interface. The contact chuck is configured to physically mate with a device under test (DUT). The magnetically retained replaceable contact plate assembly also includes a DUT layout unit (DLU) interface. The DLU is configured to couple to multiple magnetically retained replaceable contact plate assemblies and to a semiconductor handler unit. The DLU is configured to position DUTs within a test environment. The magnetically retained replaceable contact plate assembly is configured to magnetically attach to the DLU.

Abstract: Embodiments of the present invention provide a magnetically retained replaceable contact plate assembly. The magnetically retained replaceable contact plate assembly includes a contact chuck interface. The contact chuck is configured to physically mate with a device under test (DUT). The magnetically retained replaceable contact plate assembly also includes a DUT layout unit interface (DLU). The DLU is configured to couple to multiple magnetically retained replaceable contact plate assemblies and to a semiconductor handler unit. The DLU is configured to move DUTs within a test environment, and the magnetically retained replaceable contact plate assembly is configured to magnetically attach to said DLU.

Abstract: Embodiments of the present invention provide a contact chuck test head for a handler of an integrated circuit tester system. The contact chuck test head comprises a magnetically held DUT contact unit that can be replaced by a technician without requiring any tool or special equipment. The contact chuck test head t is mounted to an automated handler. Magnets are employed at an interface between the DUT contact unit and contact chuck base. This allows the DUT contact unit to be brought into close proximity to the contact chuck base portion and magnetic forces act to both align and mate the two parts together. Since the DUT contact unit requires change out to accommodate different sizes and types of DUTs, it is advantageous to provide an easy swap-out mechanism.

Abstract: A conveyor assembly includes a motor, a gear assembly operatively coupled to the motor, and a paddle assembly including a plurality of paddles operatively coupled to the gear assembly. Each paddle extends longitudinally between opposing housing walls. Each paddle includes a plurality of blades and a plurality of gaps that are alternatingly disposed along a shaft that extends through a center of each blade. A first portion of paddles includes a first portion of blades and a first portion of gaps. A second portion of paddles includes a second portion of blades and a second portion of gaps. The first portion of blades can rotate through the second portion of gaps. The second portion of blades can rotate through the first portion of gaps. The paddles can sequentially rotate about the respective paddle axes such that each paddle can be disposed at a different angular position than an adjacent paddle.

Abstract: A conveyor assembly includes a motor, a gear assembly operatively coupled to the motor, and a paddle assembly including a plurality of paddles operatively coupled to the gear assembly. Each paddle extends longitudinally between opposing housing walls. Each paddle includes a plurality of blades and a plurality of gaps that are alternatingly disposed along a shaft that extends through a center of each blade. A first portion of paddles includes a first portion of blades and a first portion of gaps. A second portion of paddles includes a second portion of blades and a second portion of gaps. The first portion of blades can rotate through the second portion of gaps. The second portion of blades can rotate through the first portion of gaps. The paddles can sequentially rotate about the respective paddle axes such that each paddle can be disposed at a different angular position than an adjacent paddle.