Patents by Inventor Patrick T. Bohan

Patrick T. Bohan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for testing a device
    Patent number: 7437262
    Abstract: A system for testing a device includes a processor that operates to execute instructions, where the instructions are used to test a device. The processor also operates to generate test signals associated with the test instructions. An interface apparatus is coupled to the processor and operates to communicate the test signals to the device. The interface apparatus includes connectors, where each connector operates to communicate at least one of the test signals.
    Type: Grant
    Filed: August 18, 2003
    Date of Patent: October 14, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: William C. Boose, Dale A. Heaton, Patrick T. Bohan
  • Diagnostic compiler for pipeline analog-to-digital converter, method of compiling and test system employing the same
    Patent number: 7356424
    Abstract: The present invention is directed to a diagnostic compiler for use with a pipeline analog-to-digital converter (ADC) having code sequences corresponding to stages thereof. In one embodiment, the diagnostic compiler includes a transition locator configured to determine transition locations for the code sequences. The diagnostic compiler also includes a characteristics indicator coupled to the transition locator and configured to provide at least one characteristic of the ADC based on the transition locations.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: April 8, 2008
    Assignee: Texas Instruments Incorporated
    Inventor: Patrick T. Bohan