Abstract: Device for testing a network of components, in particular an electronic circuit.The respective potential differences between the terminals of the circuit to be tested are acquired during a chosen time interval and stored in a values memory. A memory contains predetermined functional models of electronic components. The processing means, connected to these memories, are capable of effecting a processing comprising the estimation, during said time interval, of physical values, notably of current-expressions, taking account of expressions contained in said acquired models and values, and storing them in the values memory as well as tests on the values contained in the values memory.