Patents by Inventor Patrick W. Miller

Patrick W. Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated test structure and method for verification of microelectronic devices
    Patent number: 6549150
    Abstract: An integrated test structure adapted to facilitate manufacturing verification of microelectronic devices such as Digital to Analog Converters (DAC) is disclosed. The test circuitry and the Circuit Under Test (CUT) are placed on an IC along with an arbitrary amount of digital logic, which drives the input of the CUT. These inputs are translated into an analog output. During a manufacturing test, this output is measured in order to determine that the IC has been manufactured correctly. The analog input of the circuit is coupled to the analog output of the DAC. The digital output of the test circuitry is coupled to the digital logic on the IC. This configuration comprises a Built In Self Test (BIST) structure. The invention allows BIST by eliminating the need to measure the analog output of the DAC external to the IC, and enables testing the CUT by using standard digital BIST techniques.
    Type: Grant
    Filed: September 17, 2001
    Date of Patent: April 15, 2003
    Assignee: International Business Machines Corporation
    Inventors: Raymond J. Bulaga, John K. Masi, Patrick W. Miller, Mark S. Styduhar, Donald L. Wheater
  • INTEGRATED TEST STRUCTURE AND METHOD FOR VERIFICATION OF MICROELECTRONIC DEVICES
    Publication number: 20030063019
    Abstract: An integrated test structure adapted to facilitate manufacturing verification of microelectronic devices such as Digital to Analog Converters (DAC) is disclosed. The test circuitry and the Circuit Under Test (CUT) are placed on an IC along with an arbitrary amount of digital logic, which drives the input of the CUT. These inputs are translated into an analog output. During a manufacturing test, this output is measured in order to determine that the IC has been manufactured correctly. The analog input of the circuit is coupled to the analog output of the DAC. The digital output of the test circuitry is coupled to the digital logic on the IC. This configuration comprises a Built In Self Test (BIST) structure. The invention allows BIST by eliminating the need to measure the analog output of the DAC external to the IC, and enables testing the CUT by using standard digital BIST techniques.
    Type: Application
    Filed: September 17, 2001
    Publication date: April 3, 2003
    Inventors: Raymond J. Bulaga, John K. Masi, Patrick W. Miller, Mark S. Styduhar, Donald L. Wheater