Patents by Inventor Patrick Wallace Kempsey

Patrick Wallace Kempsey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in self-test circuit for read channel device
    Patent number: 6163865
    Abstract: A BIST circuit for use with a read channel device is disclosed that utilizes internally generated clock and control signals to control a test sequence. A linear feedback shift register is used as the signature analysis register. The test signature accumulation process is controlled by clock and control signals internal to the read charnel device that are associated with the normal operation of the read channel device.
    Type: Grant
    Filed: July 22, 1998
    Date of Patent: December 19, 2000
    Assignee: Lucent Technologies, Inc.
    Inventor: Patrick Wallace Kempsey