Patents by Inventor Patrick Yung

Patrick Yung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Adaptable dual delta-P flow measurement
    Patent number: 11008948
    Abstract: A system includes a venturi duct, a first delta P sensor, a second delta P sensor, and an ECS controller. The venturi duct is configured to receive a first bleed air flow or a second bleed air flow. The first and second delta P sensors are configured to sense a first and second pressure difference between a first point and a second point of the venturi duct. The first and second delta P sensors are configured to sense pressure difference over different pressure ranges. The ECS controller is configured determine a flow rate of an ECS air flow based upon the first pressure and/or second sensed pressure differences.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: May 18, 2021
    Assignee: Hamilton Sundstrand Corporation
    Inventors: Robert M. DeRoy, Patrick Yung, John M. Maljanian, Jeffry K. Kamenetz, Mark Vignali, John A. Schwemmer
  • ADAPTABLE DUAL DELTA-P FLOW MEASUREMENT
    Publication number: 20200088107
    Abstract: A system includes a venturi duct, a first delta P sensor, a second delta P sensor, and an ECS controller. The venturi duct is configured to receive a first bleed air flow or a second bleed air flow. The first and second delta P sensors are configured to sense a first and second pressure difference between a first point and a second point of the venturi duct. The first and second delta P sensors are configured to sense pressure difference over different pressure ranges. The ECS controller is configured determine a flow rate of an ECS air flow based upon the first pressure and/or second sensed pressure differences.
    Type: Application
    Filed: September 13, 2018
    Publication date: March 19, 2020
    Inventors: Robert M. DeRoy, Patrick Yung, John M. Maljanian, Jeffry K. Kamenetz, Mark Vignali, John A. Schwemmer