Abstract: A test system and method are provided for testing in parallel radiant output of multiple light emitting devices. Generally, the method involves: (i) providing a system having a master, calibrated power meter (CPM), a source transfer standard (STS), and multiple secondary, test site power meters (TSPMs); (ii) determining a relationship between electrical power supplied to the STS and a radiant output therefrom as measured by the CPM; (iii) calibrating the TSPMs using the STS and the relationship between the power supplied to the STS and the radiant output therefrom as determined by the CPM; and (iv) positioning the devices undergoing test on a fixture of the test system and positioning the fixture relative to the TSPMs to test radiant outputs of the devices.

Abstract: A semiconductor (preferably a CMOS) device having one or more latch-up inhibitor diffusion regions. The latch-up inhibitor regions are adjacent to complementary P-channel and N-channel transistors, and typically function to inhibit or prevent latch-up, without increasing the die size of the device.