Abstract: A method, implemented by a software-controlled computer device and/or by dedicated hardware, for probing an electrically conductive target material, e.g. molten metal or semiconductor material, in a metallurgical vessel. In the method, a measurement signal is acquired from a sensor, which is inserted into the target material, during a relative displacement between the electrically conductive target material and the sensor, the measurement signal being indicative of electrical conductivity in the vicinity of the sensor. The measurement signal is generated to represent momentary changes in an electromagnetic field around the sensor, which is created by operating at least one coil in the sensor. Based on the measurement signal, a signal profile is generated to be indicative of the electrical conductivity as a function of the relative movement. The method enables a probing of the internal distribution of the target material in the vessel at any level of detail.

Abstract: A method, implemented by a software-controlled computer device and/or by dedicated hardware, for probing an electrically conductive target material, e.g. molten metal or semiconductor material, in a metallurgical vessel. In the method, a measurement signal is acquired from a sensor, which is inserted into the target material, during a relative displacement between the electrically conductive target material and the sensor, the measurement signal being indicative of electrical conductivity in the vicinity of the sensor. The measurement signal is generated to represent momentary changes in an electromagnetic field around the sensor, which is created by operating at least one coil in the sensor. Based on the measurement signal, a signal profile is generated to be indicative of the electrical conductivity as a function of the relative movement. The method enables a probing of the internal distribution of the target material in the vessel at any level of detail.