Patents by Inventor Patrik Hoffmann

Patrik Hoffmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180318958
    Abstract: A method for locally modifying a structure of a paperboard. A penetrating region (114) of the paperboard (110) is penetrated by laser radiation (102) such that moisture in the penetrating region (114) evaporates for locally modifying the structure of the penetrating region (114) e.g. by weakening the paperboard at the region and for deforming it there.
    Type: Application
    Filed: November 10, 2016
    Publication date: November 8, 2018
    Inventors: Sébastien EQUIS, Patrik HOFFMANN, Gilles PILLONEL, Sébastien VAUCHER, Kilian WASMER
  • Patent number: 9909218
    Abstract: A method and apparatus for local beam processing using a beam activated gas to etch material are described. Compounds are disclosed that are suitable for beam-induced etching. The invention is particularly suitable for electron beam induced etching of chromium materials on lithography masks. In one embodiment, a polar compound, such as ClNO2 gas, is activated by the electron beam to selectively etch a chromium material on a quartz substrate. By using an electron beam in place of an ion beam, many problems associated with ion beam mask repair, such as staining and riverbedding, are eliminated. Endpoint detection is not critical because the electron beam and gas will not etch significantly the substrate.
    Type: Grant
    Filed: January 12, 2010
    Date of Patent: March 6, 2018
    Assignee: Ecole Polytechnique Federales de Lausanne
    Inventors: Tristan Bret, Patrik Hoffmann, Michel Rossi, Xavier Multone
  • Publication number: 20150114566
    Abstract: The invention relates to an effusing source for film deposition made of a reservoir comprising one hole characterized by the fact that the hole diameter is less than one order of magnitude than the mean free path of the molecules determined by the pressure and its thickness is at least one order of magnitude smaller than the diameter. Preferably the source has several holes.
    Type: Application
    Filed: October 6, 2014
    Publication date: April 30, 2015
    Inventors: Giacomo BENVENUTI, Estelle HALARY-WAGNER, Simone AMOROSI, Patrik HOFFMANN
  • Patent number: 8852344
    Abstract: The invention relates to an effusing source for film deposition made of a reservoir comprising one hole characterized by the fact that the hole diameter is less than one order of magnitude than the mean free path of the molecules determined by the pressure and its thickness is at least one order of magnitude smaller than the diameter. Preferably the source has several holes.
    Type: Grant
    Filed: October 24, 2011
    Date of Patent: October 7, 2014
    Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
    Inventors: Giacomo Benvenuti, Estelle Halary-Wagner, Simone Amorosi, Patrik Hoffmann
  • Patent number: 8381914
    Abstract: A method for separating and recovering silicon debris from sawing waste is characterized in that it includes the following steps: —treating the sawing waste so as to deoxidize the silicon debris in a manner that reduces their surface energy, —applying to the sawing waste thus treated a flotation method using a flotation liquid and a nonoxidizing flotation gas, and —recovering the silicon debris at the surface of the flotation liquid.
    Type: Grant
    Filed: December 4, 2008
    Date of Patent: February 26, 2013
    Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
    Inventor: Patrik Hoffmann
  • Publication number: 20120037077
    Abstract: The invention relates to an effusing source for film deposition made of a reservoir comprising one hole characterized by the fact that the hole diameter is less than one order of magnitude than the mean free path of the molecules determined by the pressure and its thickness is at least one order of magnitude smaller than the diameter. Preferably the source has several holes.
    Type: Application
    Filed: October 24, 2011
    Publication date: February 16, 2012
    Inventors: Giacomo Benvenuti, Estelle Halary-Wagner, Simone Amorosi, Patrik Hoffmann
  • Publication number: 20100278707
    Abstract: A method for separating and recovering silicon debris from sawing waste is characterized in that it includes the following steps:—treating the sawing waste so as to deoxidize the silicon debris in a manner that reduces their surface energy,—applying to the sawing waste thus treated a flotation method using a flotation liquid and a nonoxidizing flotation gas, and—recovering the silicon debris at the surface of the flotation liquid.
    Type: Application
    Filed: December 4, 2008
    Publication date: November 4, 2010
    Applicant: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventor: Patrik Hoffmann
  • Publication number: 20100203431
    Abstract: A method and apparatus for local beam processing using a beam activated gas to etch material are described. Compounds are disclosed that are suitable for beam-induced etching. The invention is particularly suitable for electron beam induced etching of chromium materials on lithography masks. In one embodiment, a polar compound, such as ClNO2 gas, is activated by the electron beam to selectively etch a chromium material on a quartz substrate. By using an electron beam in place of an ion beam, many problems associated with ion beam mask repair, such as staining and riverbedding, are eliminated. Endpoint detection is not critical because the electron beam and gas will not etch significantly the substrate.
    Type: Application
    Filed: January 12, 2010
    Publication date: August 12, 2010
    Inventors: Tristan Bret, Patrik Hoffmann, Michel Rossi, Xavier Multone
  • Patent number: 7745297
    Abstract: The substrate with electrodes is formed of a transparent material onto which is deposited a film (1) of a transparent conductive material of thickness e1 and of refractive index n1, said film being structured to form a set of electrodes (1a) whose contours (8) delimit insulating spaces (3), wherein the insulating spaces (3) are filled with a transparent dielectric material of thickness e2 and of refractive index n2 so that the respective thicknesses of the conductive material and the dielectric material are inversely proportional to the values of the refractive indices of said materials and said dielectric material forms neither depressions nor beads at the contour (8) of the electrodes. A hardcoating layer (7) may be disposed between the substrate (5) and the electrodes and a protective film (9) added. The substrate with electrodes is obtained by UV irradiation through a single mask.
    Type: Grant
    Filed: January 24, 2008
    Date of Patent: June 29, 2010
    Assignee: Asulab S.A.
    Inventors: Joachim Grupp, Gian-Carlo Poli, Pierre-Yves Baroni, Estelle Wagner, Patrik Hoffmann
  • Patent number: 7670956
    Abstract: A method and apparatus for local beam processing using a beam activated gas to etch material are described. Compounds are disclosed that are suitable for beam-induced etching. The invention is particularly suitable for electron beam induced etching of chromium materials on lithography masks. In one embodiment, a polar compound, such as ClNO2 gas, is activated by the electron beam to selectively etch a chromium material on a quartz substrate. By using an electron beam in place of an ion beam, many problems associated with ion beam mask repair, such as staining and riverbedding, are eliminated. Endpoint detection is not critical because the electron beam and gas will not etch significantly the substrate.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: March 2, 2010
    Assignee: FEI Company
    Inventors: Tristan Bret, Patrik Hoffmann, Michel Rossi, Xavier Multone
  • Patent number: 7514188
    Abstract: A process for providing a security paper, in particular a banknote, with a coloured marking, comprising providing a photosensitive preparation on a portion of said document and submitting at least selected areas of said portion to a light beam, wherein said preparation is capable of forming a film on said portion and comprises a substance capable of producing colloidal metal particles under the effect of UV irradiation, and said areas are irradiated by means of an UV-light beam.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: April 7, 2009
    Assignee: KBA-Giori S.A.
    Inventors: Patrik Hoffmann, Tristan Bret, Vincent Moreau
  • Patent number: 7449732
    Abstract: The substrate with electrodes is formed of a transparent material onto which is deposited a film (1) of a transparent conductive material of thickness e1 and of refractive index n1, said film being structured to form a set of electrodes (1a) whose contours (8) delimit insulating spaces (3), wherein the insulating spaces (3) are filled with a transparent dielectric material of thickness e2 and of refractive index n2 so that the respective thicknesses of the conductive material and the dielectric material are inversely proportional to the values of the refractive indices of said materials and said dielectric material forms neither depressions nor beads at the contour (8) of the electrodes. A hardcoating layer (7) may be disposed between the substrate (5) and the electrodes and a protective film (9) added. The substrate with electrodes is obtained by UV irradiation through a single mask.
    Type: Grant
    Filed: March 5, 2004
    Date of Patent: November 11, 2008
    Assignee: Asulab S.A.
    Inventors: Joachim Grupp, Gian-Carlo Poli, Pierre-Yves Baroni, Estelle Wagner, Patrik Hoffmann
  • Publication number: 20080145959
    Abstract: The substrate with electrodes is formed of a transparent material onto which is deposited a film (1) of a transparent conductive material of thickness e1 and of refractive index n1, said film being structured to form a set of electrodes (1a) whose contours (8) delimit insulating spaces (3), wherein the insulating spaces (3) are filled with a transparent dielectric material of thickness e2 and of refractive index n2 so that the respective thicknesses of the conductive material and the dielectric material are inversely proportional to the values of the refractive indices of said materials and said dielectric material forms neither depressions nor beads at the contour (8) of the electrodes. A hardcoating layer (7) may be disposed between the substrate (5) and the electrodes and a protective film (9) added. The substrate with electrodes is obtained by UV irradiation through a single mask.
    Type: Application
    Filed: January 24, 2008
    Publication date: June 19, 2008
    Applicant: ASULAB S.A.
    Inventors: Joachim Grupp, Gian-Carlo Poli, Pierre-Yves Baroni, Estelle Wagner, Patrik Hoffmann
  • Publication number: 20070193519
    Abstract: The invention relates to an effusing source for film deposition made of a reservoir comprising one hole characterized by the fact that the hole diameter is less than one order of magnitude than the mean free path of the molecules determined by the pressure and its thickness is at least one order of magnitude smaller than the diameter. Preferably the source has several holes.
    Type: Application
    Filed: April 16, 2007
    Publication date: August 23, 2007
    Applicant: Ecole Polytechnique Federale De Lausanne (EPFL)
    Inventors: Giacomo Benvenuti, Estelle Halary-Wagner, Simone Amorosi, Patrik Hoffmann
  • Publication number: 20060228634
    Abstract: A method and apparatus for local beam processing using a beam activated gas to etch material are described. Compounds are disclosed that are suitable for beam-induced etching. The invention is particularly suitable for electron beam induced etching of chromium materials on lithography masks. In one embodiment, a polar compound, such as ClNO2 gas, is activated by the electron beam to selectively etch a chromium material on a quartz substrate. By using an electron beam in place of an ion beam, many problems associated with ion beam mask repair, such as staining and riverbedding, are eliminated. Endpoint detection is not critical because the electron beam and gas will not etch significantly the substrate.
    Type: Application
    Filed: April 8, 2005
    Publication date: October 12, 2006
    Applicant: FEI Company
    Inventors: Tristan Bret, Patrik Hoffmann, Michel Rossi, Xavier Multone
  • Publication number: 20050247120
    Abstract: A method for the gas phase deposition of partially fluorinated or perfluorinated alkyl silanes onto a substrate in a reaction chamber includes cleaning the substrate, hydrating the substrate with steam, drying the substrate and silanization of the substrate by deposition of the alkyl silane from the gas phase. The cleaning of the substrate is a plasma etching process and the hydration occurs directly after the plasma etching.
    Type: Application
    Filed: April 18, 2005
    Publication date: November 10, 2005
    Inventors: Patrik Hoffmann, Gerit Kulig, Laura Barbieri
  • Publication number: 20040238835
    Abstract: The substrate with electrodes is formed of a transparent material onto which is deposited a film (1) of a transparent conductive material of thickness e1 and of refractive index n1, said film being structured to form a set of electrodes (1a) whose contours (8) delimit insulating spaces (3), wherein the insulating spaces (3) are filled with a transparent dielectric material of thickness e2 and of refractive index n2 so that the respective thicknesses of the conductive material and the dielectric material are inversely proportional to the values of the refractive indices of said materials and said dielectric material forms neither depressions nor beads at the contour (8) of the electrodes. A hardcoating layer (7) may be disposed between the substrate (5) and the electrodes and a protective film (9) added.
    Type: Application
    Filed: March 5, 2004
    Publication date: December 2, 2004
    Applicant: Asulab S. A.
    Inventors: Joachim Grupp, Gian-Carlo Poli, Pierre-Yves Baroni, Estelle Wagner, Patrik Hoffmann
  • Publication number: 20030094711
    Abstract: The invention relates to a device for producing a gas mixture consisting of HMDSO and oxygen, whereby process gas is produced. In order to be able to continuously produce a large volume of process gas using such a device and to be able to withdraw the same at practical processable temperatures, the invention provides that a number of filling packages (2) are stacked in an elongated essentially vertical column (1) that can be cooled. In addition, an inlet tube (3), which is inserted into the column (1) from the exterior, and a gas outlet connection (6), which leads to the exterior, are secured in the upper area of said column (1). Devices (26) are also provided for measuring the temperature, the pressure and the amount of the exiting gas mixture. In addition, a distribution cup (29) which spans the cross-section of the column (1) and which is provided with gas flow-through openings (38) is placed underneath the inner discharge end (4) of the inlet tube (3).
    Type: Application
    Filed: September 3, 2002
    Publication date: May 22, 2003
    Inventors: Rodney Moore, Andreas Henkel-Luttringhaus, Patrik Hoffmann