Patents by Inventor Paul A. Bogucki

Paul A. Bogucki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test flow to detect a latent leaky bit of a non-volatile memory
    Patent number: 8995202
    Abstract: A technique for detecting a leaky bit of a non-volatile memory includes erasing cells of a non-volatile memory. A bias stress is applied to the cells subsequent to the erasing. An erase verify operation is performed on the cells subsequent to the applying a bias stress to the cells. Finally, it is determined whether the cells pass or fail the erase verify operation based on whether respective threshold voltages of the cells are below an erase verify level.
    Type: Grant
    Filed: May 21, 2012
    Date of Patent: March 31, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Fuchen Mu, Paul A Bogucki, Chen He
  • TEST FLOW TO DETECT A LATENT LEAKY BIT OF A NON-VOLATILE MEMORY
    Publication number: 20130308402
    Abstract: A technique for detecting a leaky bit of a non-volatile memory includes erasing cells of a non-volatile memory. A bias stress is applied to the cells subsequent to the erasing. An erase verify operation is performed on the cells subsequent to the applying a bias stress to the cells. Finally, it is determined whether the cells pass or fail the erase verify operation based on whether respective threshold voltages of the cells are below an erase verify level.
    Type: Application
    Filed: May 21, 2012
    Publication date: November 21, 2013
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Fuchen Mu, Paul A. Bogucki, Chen He