Patents by Inventor Paul A. LeBerge

Paul A. LeBerge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7366966
    Abstract: A testing system includes a phase interpolator receiving a clock signal. An output of the phase interpolator is coupled to both a first signal distribution tree that includes a first delay line in each of its branches and a second signal distribution tree that includes a second delay line in each of its branches, thereby producing respective first and second delayed clock signals. A test signal generator generates a plurality of test signals that may simulate memory command or address signal. A multiplexer couples the test signals to first and second inputs of a transmitter in a normal test mode but to only the first input in a special test mode. The transmitter outputs the signal applied to its first input responsive to the first delayed clock signal and it outputs the signal applied to its second input responsive to the second delayed clock signal.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: April 29, 2008
    Assignee: Micron Technology, Inc.
    Inventor: Paul A. LeBerge