Patents by Inventor Paul Anzalone

Paul Anzalone has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7442924
    Abstract: A method of sample extraction entails making multiple, overlapping cuts using a beam, such as a focused ion beam, to create a trench around a sample, and then undercutting the sample to free it. Because the sidewalls of the cut are not vertical, the overlapping cuts impinge on the sloping sidewalls formed by previous cuts. The high angle of incidence provides a greatly enhanced mill rate, so that making multiple overlapping cuts to produce a wide trench can requires less time than making a single, deep cut around the perimeter of a sample.
    Type: Grant
    Filed: February 9, 2006
    Date of Patent: October 28, 2008
    Assignee: FEI, Company
    Inventors: Lucille A. Giannuzzi, Paul Anzalone, Richard Young, Daniel W. Phifer, Jr.
  • Publication number: 20060186336
    Abstract: A method of sample extraction entails making multiple, overlapping cuts using a beam, such as a focused ion beam, to create a trench around a sample, and then undercutting the sample to free it. Because the sidewalls of the cut are not vertical, the overlapping cuts impinge on the sloping sidewalls formed by previous cuts. The high angle of incidence provides a greatly enhanced mill rate, so that making multiple overlapping cuts to produce a wide trench can requires less time than making a single, deep cut around the perimeter of a sample.
    Type: Application
    Filed: February 9, 2006
    Publication date: August 24, 2006
    Applicant: FEI Company
    Inventors: Lucille Giannuzzi, Paul Anzalone, Richard Young, Daniel Phifer