Patents by Inventor Paul Bengtsson

Paul Bengtsson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Iterative feedback tuning in a scanning probe microscope
    Patent number: 8250667
    Abstract: A method, system, device, and software for automatically determining PI feedback parameters in a scanning probe microscopy application setup using an iterative feedback tuning process.
    Type: Grant
    Filed: December 1, 2008
    Date of Patent: August 21, 2012
    Assignee: Nanofactory Instruments AB
    Inventors: Krister Svensson, Paul Bengtsson, Simon J. Altenburg
  • ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE
    Publication number: 20110016592
    Abstract: A method, system, device, and software for automatically determining PI feedback parameters in a scanning probe microscopy application setup using an iterative feedback tuning process.
    Type: Application
    Filed: December 1, 2008
    Publication date: January 20, 2011
    Applicant: NANOFACTORY INSTRUMENTS AB
    Inventors: Krister Svensson, Paul Bengtsson
  • SAFE MOTION
    Publication number: 20100230608
    Abstract: The present invention relates to an inertial slider (10) and a method for safely and controllably approach an object (2) towards a fixed object (3) for instance inside a transmission electron microscope (101). The inertial slider is controlled with a control signal (201) with a timing characteristic faster than a mechanical resonance of the object to be moved. The inertial slider moves in a first step away from the fixed object and the movable object is moved relative the inertial slider in that first step.
    Type: Application
    Filed: March 2, 2007
    Publication date: September 16, 2010
    Applicant: NANOFACTORY INSTRUMENTS AB
    Inventors: Paul Bengtsson, Krister Svensson, Håkan Olin, Mikael Von Dorrien
  • Device for reducing the impact of distortions in a microscope
    Patent number: 6924489
    Abstract: This invention relates to a device for reducing the impact of undesired distortions when studying a sample in an electron microscope, wherein said sample is arranged to be mounted on a micro-positioning device, characterised in that said micro-positioning device is connected with a control device, being arranged to control said micro-positioning device so as to compensate for measurement errors due to undesired distortions.
    Type: Grant
    Filed: January 13, 2004
    Date of Patent: August 2, 2005
    Assignee: Nanofactory Instruments AB
    Inventors: Håkan Olin, Drister Svensson, Fredrik Althoff, Andrey Danilov, Paul Bengtsson, Martin Hospers
  • Device for reducing the impact of distortions in a microscope
    Publication number: 20040195523
    Abstract: This invention relates to a device for reducing the impact of undesired distortions when studying a sample in an electron microscope, wherein said sample is arranged to be mounted on a micro-positioning device, characterised in that said micro-positioning device is connected with a control device, being arranged to control said micro-positioning device so as to compensate for measurement errors due to undesired distortions.
    Type: Application
    Filed: January 13, 2004
    Publication date: October 7, 2004
    Inventors: Hakan Olin, Krister Svensson, Fredrik Althoff, Andrey Danilov, Paul Bengtsson, Martin Hospers