Patents by Inventor Paul Bron

Paul Bron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8450802
    Abstract: Laterally diffused metal oxide semiconductor transistor for a radio frequency-power: amplifier comprising a drain finger (25,27) which drain finger is connected to a stack of one or more metal interconnect layers, (123,61,59,125) wherein a metal interconnect layer (123) of said stack is connected to a drain region (25) on the substrate, wherein said stack comprises a field plate (123, 125, 121) adapted to reduce the maximum magnitude of the electric field between the drain and the substrate and overlying the tip of said drain finger.
    Type: Grant
    Filed: July 20, 2009
    Date of Patent: May 28, 2013
    Assignee: NXP B.V.
    Inventors: Johannes Adrianus Maria De Boet, Henk Jan Peuscher, Paul Bron, Stephan Jo Cecile Henri Theeuwen
  • Publication number: 20110121389
    Abstract: Laterally diffused metal oxide semiconductor transistor for a radio frequency-power: amplifier comprising a drain finger (25,27) which drain finger is connected to a stack of one or more metal interconnect layers, (123,61,59,125) wherein a metal interconnect layer (123) of said stack is connected to a drain region (25) on the substrate, wherein said stack comprises a field plate (123, 125, 121) adapted to reduce the maximum magnitude of the electric field between the drain and the substrate and overlying the tip of said drain finger.
    Type: Application
    Filed: July 20, 2009
    Publication date: May 26, 2011
    Applicant: NXP B.V.
    Inventors: Johannes Adrianus Maria De Boet, Henk Jan Peuscher, Paul Bron, Stephan Jo Cecile Henri Theeuwen
  • Publication number: 20110073946
    Abstract: An LDMOS transistor (100) on a substrate (70a, 70b) of a first conductivity type, comprises a source region (10) with a source portion (73) and a drain region (12). The source portion and drain region are of a second conductivity type opposite to the first conductivity type and are mutually connected through a channel region (28) in the substrate over which a gate electrode (14) extends. The drain region comprises a drain contact region (16) and a drain extension region (15) which extends from the channel region (28) towards the drain contact region. The drain contact region is electrically connected to a top metal layer (22) by a drain contact (20), and a poly-Si drain contact layer (80) is arranged as a first contact material in between the drain contact region and the drain contact in a contact opening (51) of a first dielectric layer (52) deposited on the surface of the drain region.
    Type: Application
    Filed: May 19, 2009
    Publication date: March 31, 2011
    Applicant: NXP B.V.
    Inventors: Stephan J. C. H. Theeuwen, Henk J. Peuscher, Rene Van Den Heuvel, Paul Bron