Abstract: According to one aspect of the invention apparatus is provided for electrical testing of a substrate having a plurality of terminals. The apparatus includes a frame, a probe card, a translation device, an alignment device, and a holder. The probe card includes a probe card backing member and a plurality of probes extending from the probe card backing member and is secured to the frame. The translation device is secured to the frame. The alignment device is located on the translation device. The holder is capable of holding a substrate and is secured to the alignment device. The alignment device is operable to cause alignment movement of the holder past the probe card so that selected ones of the terminals are brought into alignment with selected ones of the probes. The translation device is operable to cause translational movement, transverse to the alignment movement, of the alignment device with the holder towards the probe card.

Abstract: According to one aspect of the invention apparatus is provided for electrical testing of a substrate having a plurality of terminals. The apparatus includes a frame, a probe card, a translation device, an alignment device, and a holder. The probe card includes a probe card backing member and a plurality of probes extending from the probe card backing member and is secured to the frame. The translation device is secured to the frame. The alignment device is located on the translation device. The holder is capable of holding a substrate and is secured to the alignment device. The alignment device is operable to cause alignment movement of the holder past the probe card so that selected ones of the terminals are brought into alignment with selected ones of the probes. The translation device is operable to cause translational movement, transverse to the alignment movement, of the alignment device with the holder towards the probe card.

Abstract: According to one aspect of the invention apparatus is provided for electrical testing of a substrate having a plurality of terminals. The apparatus includes a frame, a probe card, a translation device, an alignment device, and a holder. The probe card includes a probe card backing member and a plurality of probes extending from the probe card backing member and is secured to the frame. The translation device is secured to the frame. The alignment device is located on the translation device. The holder is capable of holding a substrate and is secured to the alignment device. The alignment device is operable to cause alignment movement of the holder past the probe card so that selected ones of the terminals are brought into alignment with selected ones of the probes. The translation device is operable to cause translational movement, transverse to the alignment movement, of the alignment device with the holder towards the probe card.

Abstract: A system is disclosed for correcting for rotational errors in a linear motor system. A shunt resistor is coupled in parallel with a winding of a phase of a motor of the linear motor system to correct for rotational errors caused by differences in the magnetic characteristics of the motors comprising the linear motor system. Yaw error values for the motors are sequentially measured to determine the value of the shunt resistor, and its location on a winding of a phase motor of the linear motor system.

Abstract: An apparatus and method for positioning a first stage relative to a second stage. An apparatus of the present invention comprises a motor system to move the first and second stages relative to each other and a motion control system to control the path of the stage being moved. One stage has a continuous surface with a continuous magnetizable region. Nonmagnetizable regions are uniformly patterned within the magnetizable region. A method of the present invention involves the construction of a stage by etching a plurality of though holes in a sheet and affixing the sheet to the top surface of a foundation. The present invention improves the accuracy and speed of a positioning stage.

Abstract: A method and apparatus for positioning rectilinearly a wafer holding platform by performing rotations in a positioning system. A method comprises coupling a first clamp to a wafer holding platform, decoupling a second clamp from the wafer holding platform, and rotating the first clamp to cause the wafer holding platform to be moved to a first position. Further couplings, decouplings, and rotations may be performed to achieve a rectilinear translation to a final position without a resultant rotation after the rectilinear translation. An apparatus of the invention comprises a first clamp having a first axis of rotation, a second clamp having a second axis of rotation, where the first axis and the second axis are not concentric. A wafer holding platform is independently couplable to the first clamp and to the second clamp and has a plurality of points on the wafer holding platform which are positionable at a plurality of X,Y locations by rotating independently the first and second clamps.