Patents by Inventor Paul C. Goodley
Paul C. Goodley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8502162Abstract: An atmospheric pressure ionization apparatus includes a chamber, an ion inlet structure, an electrode, a sample emitter, and a gas passage. The ion inlet structure includes a sampling orifice. The electrode includes an electrode bore. An ionization region is defined between the ion inlet structure and the electrode. The flared structure is coaxially disposed about the ion inlet structure, and extends along an outward direction that includes a radial component relative to the sampling axis. The sample emitter is oriented at an angle to the sampling axis for directing a sample stream toward the ionization region. The gas passage directs a stream of gas from a gas source to the chamber. The flared structure and the wall cooperatively form an outward-directed portion of the gas passage that extends annularly about the sampling axis and along the outward direction. The gas flows through the outward-directed portion, around the flared structure, and toward the ionization region and the electrode bore.Type: GrantFiled: June 20, 2011Date of Patent: August 6, 2013Assignee: Agilent Technologies, Inc.Inventors: Harvey D. Loucks, Jr., Paul C. Goodley
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Publication number: 20120318973Abstract: An atmospheric pressure ionization apparatus includes a chamber, an ion inlet structure, an electrode, a sample emitter, and a gas passage. The ion inlet structure includes a sampling orifice. The electrode includes an electrode bore. An ionization region is defined between the ion inlet structure and the electrode. The flared structure is coaxially disposed about the ion inlet structure, and extends along an outward direction that includes a radial component relative to the sampling axis. The sample emitter is oriented at an angle to the sampling axis for directing a sample stream toward the ionization region. The gas passage directs a stream of gas from a gas source to the chamber. The flared structure and the wall cooperatively form an outward-directed portion of the gas passage that extends annularly about the sampling axis and along the outward direction. The gas flows through the outward-directed portion, around the flared structure, and toward the ionization region and the electrode bore.Type: ApplicationFiled: June 20, 2011Publication date: December 20, 2012Applicant: Agilent Technologies, Inc.Inventors: Harvey D. Loucks, JR., Paul C. Goodley
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Patent number: 8129677Abstract: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.Type: GrantFiled: April 2, 2010Date of Patent: March 6, 2012Assignee: Agilent Technologies, Inc.Inventors: Jean-Luc Truche, Paul C. Goodley, Gregor Overney
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Patent number: 7855357Abstract: The present invention relates to an apparatus and method for introducing calibrant ions into a conduit, ion source and/or mass spectrometry system.Type: GrantFiled: January 17, 2006Date of Patent: December 21, 2010Assignee: Agilent Technologies, Inc.Inventors: Jean-Luc Truche, Jian Bai, Paul C Goodley
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Publication number: 20100230589Abstract: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.Type: ApplicationFiled: April 2, 2010Publication date: September 16, 2010Inventors: Jean-Luc Truche, Paul C. Goodley, Gregor Overney
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Patent number: 7737395Abstract: The present invention provides, inter alia, apparatuses and methods for ionizing samples that are in gaseous phase or can be vaporized/sublimated. The samples include samples to be analyzed and mass calibrants that serve as standards. In addition, the present invention also provides calibrant formulations that release mass calibrants in a slow, controlled manner.Type: GrantFiled: June 2, 2007Date of Patent: June 15, 2010Assignee: Agilent Technologies, Inc.Inventors: Paul C. Goodley, Harry F. Prest, Christine A. Miller, Patrick D. Perkins
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Patent number: 7723678Abstract: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.Type: GrantFiled: April 4, 2006Date of Patent: May 25, 2010Assignee: Agilent Technologies, Inc.Inventors: Jean-Luc Truche, Paul C. Goodley, Gregor Overney
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Patent number: 7462280Abstract: A liquid chromatography chip may include an analytical column. After an analyte has traveled through an analytical column defined by the chromatography chip, the analyte is routed, either directly or indirectly, to a port defined by the chromatogrpahy chip, instead of to a spray tip on-board the chromatography chip. The port may be in fluid communication with a tube or conduit that may, in turn, be coupled to another device. Such an arrangement provides for flexible interface of the chromatography chip to another device.Type: GrantFiled: July 22, 2005Date of Patent: December 9, 2008Assignee: Agilent Technologies, Inc.Inventor: Paul C. Goodley
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Patent number: 7423261Abstract: An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.Type: GrantFiled: April 5, 2006Date of Patent: September 9, 2008Assignee: Agilent Technologies, Inc.Inventors: Jean-Luc Truche, Paul C. Goodley, Steven M. Fischer, Jian Bal
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Patent number: 7385189Abstract: The present invention provides an apparatus and method for use with a mass spectrometry system. The invention provides an ion source for providing radiative heating to an ionization region. The ion source includes a nanospray ionization device for producing ions and a conduit adjacent to the ionization device for receiving ions from the ionization device. The conduit includes a conductive material for providing indirect radiative heating to the ionization region. Direct radiative heating may also be provided using a heater in the conduit. The ion source may be used separately or in conjunction with the mass spectrometry system. When used in conjunction with a mass spectrometry system a detector may also be employed down stream from the device. A method for desolvating an analyte using the device is also disclosed.Type: GrantFiled: June 29, 2005Date of Patent: June 10, 2008Assignee: Agilent Technologies, Inc.Inventors: Paul C. Goodley, Timothy Herbert Joyce, Jerry T. Dowell
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Publication number: 20080067356Abstract: An apparatus for ionizing an analyte sample with a mass calibrant is provided. The apparatus includes an ionization chamber defining an ionization region, a first passageway coupled to the ionization region for delivering the analyte sample to the ionization region, a second passageway leading to a mass analyzer having an orifice arranged adjacent to the ionization region to receive ions from the ionization region, a third passageway coupled to the ionization chamber at a first end and having a second end with an orifice arranged to receive gaseous neutral mass calibrant molecules, and an ionization device arranged within the ionization chamber. The ionization device generates primary ions from the analyte sample, and the primary ions ionize a portion of the gaseous neutral mass calibrant molecules received into the ionization region via the third passageway.Type: ApplicationFiled: September 20, 2006Publication date: March 20, 2008Inventors: Paul C. Goodley, Harry F. Prest, Christine A. Miller
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Publication number: 20080067336Abstract: The present invention provides, inter alia, apparatuses and methods for ionizing samples that are in gaseous phase or can be vaporized/sublimated. The samples include samples to be analyzed and mass calibrants that serve as standards. In addition, the present invention also provides calibrant formulations that release mass calibrants in a slow, controlled manner.Type: ApplicationFiled: June 2, 2007Publication date: March 20, 2008Inventors: Paul C. Goodley, Harry F. Prest, Christine A. Miller, Patrick D. Perkins
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Publication number: 20080048111Abstract: The invention provides a mass spectrometry system including an ion source for providing an ion spray, an ion capture device adjacent to the ion source, the ion capture device having a housing having a wall and chamber. The wall having a first aperture and a second aperture spaced from the first aperture, the first and second apertures designed for receiving an ion from the ion spray; a vacuum source in connection with the ion source for providing gas flow for entraining and directing ions that are captured by the ion capture device, wherein when the ion source is positioned adjacent to the ion capture device, the ions are captured by the first and second apertures and directed into the chamber of the housing; and a detector downstream from the ion capture device for detecting ions captured by the ion capture device.Type: ApplicationFiled: August 24, 2006Publication date: February 28, 2008Inventors: Paul C. Goodley, Timothy Herbert Joyce
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Patent number: 7204431Abstract: The invention provides an electrospray apparatus with an auxiliary electrode, and a method of using.Type: GrantFiled: October 31, 2003Date of Patent: April 17, 2007Assignee: Agilent Technologies, Inc.Inventors: Ganggiang Li, Paul C. Goodley, Hongfeng Yin
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Patent number: 7205536Abstract: A source of ions for an analyzer includes a reservoir for containing a liquid, a manifold having a plurality of nozzles, a conduit connecting the reservoir to the manifold and a counter electrode having a potential different between the counter electrode and the nozzles to enable liquid to be ejected from the nozzles in droplets and to enable ions to be ejected from the droplets.Type: GrantFiled: February 23, 2005Date of Patent: April 17, 2007Assignee: Agilent Technologies, Inc.Inventors: Paul C. Goodley, Jean-Luc Truche
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Patent number: 7115860Abstract: A source of ions for an analyzer includes a reservoir for containing a liquid, a manifold having a plurality of nozzles, a conduit connecting the reservoir to the manifold and a counter electrode having a potential different between the counter electrode and the nozzles to enable liquid to be ejected from the nozzles in droplets and to enable ions to be ejected from the droplets.Type: GrantFiled: February 23, 2005Date of Patent: October 3, 2006Inventors: Paul C. Goodley, Jean-Luc Truche
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Patent number: 6967324Abstract: A source of ions for an analyzer includes a reservoir for containing a liquid, a manifold having a plurality of nozzles, a conduit connecting the reservoir to the manifold and a counter electrode having a potential difference between the counter electrode and the nozzles to enable liquid to be ejected from the nozzles in droplets and to enable ions to be ejected from the droplets.Type: GrantFiled: August 20, 2003Date of Patent: November 22, 2005Assignee: Agilent Technologies, Inc.Inventors: Paul C. Goodley, Jean-Luc Truche
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Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry
Publication number: 20040217277Abstract: The present invention relates to an apparatus and method for use with a mass spectrometer system. The mass spectrometer system, comprises a irradiating source for ionizing a matrix based sample, a target substrate adjacent to the irradiating source for supporting the matrix based sample, the target substrate having a target surface comprising a hydrophobic material for concentrating the matrix based sample on the target surface before it is ionized to analyte ions that are discharged to the ionization region. A collecting capillary is downstream from the irradiating source for receiving the analyte ions produced and discharged from the target substrate to the ionization region. A detector is also downstream from the collecting capillary for detecting the analyte ions received from the collecting capillary.Type: ApplicationFiled: April 30, 2003Publication date: November 4, 2004Inventors: Paul C. Goodley, Jean-Luc Truche, Jian Bai -
Patent number: 6797946Abstract: A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.Type: GrantFiled: August 13, 2003Date of Patent: September 28, 2004Assignee: Agilent Technologies, Inc.Inventors: James A. Apffel, Jr., Mark H. Werlich, James L. Bertsch, Paul C. Goodley, Kent D. Henry
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Publication number: 20040046118Abstract: A method and apparatus are disclosed wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The invention provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.Type: ApplicationFiled: August 13, 2003Publication date: March 11, 2004Inventors: James A. Apffel, Mark H. Werlich, James L. Bertsch, Paul C. Goodley, Kent D. Henry