Abstract: A connection interface system positions and electrically connects a testing device to a device under test. The testing device exercises and tests the device under test. The connection interface system includes a receiver module electrically connected to the device under test and including receiver electrical connectors. The receiver module includes a top frame and a bottom frame, movable with respect to the top frame and operatively connected thereto. The bottom frame includes at least one receiver module having at least one receiver electrical connector. The receiver module further includes an engagement mechanism movably connected to the bottom frame and to the top frame which either engages or disengages the bottom frame and the top frame in response to an external stimulus to engage or disengage receiver electrical connectors in the bottom frame to external electrical connectors.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: A connection interface system positions and electrically connects a testing device to a device under test. The testing device exercises and tests the device under test. The connection interface system includes a receiver module electrically connected to the device under test and including receiver electrical connectors. The receiver module includes a top frame and a bottom frame, movable with respect to the top frame and operatively connected thereto. The bottom frame includes at least one receiver module having at least one receiver electrical connector. The receiver module further includes an engagement mechanism movably connected to the bottom frame and to the top frame which either engages or disengages the bottom frame and the top frame in response to an external stimulus to engage or disengage receiver electrical connectors in the bottom frame to external electrical connectors.

Abstract: An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cavities, respectively. In addition, the electrical test probe assembly includes first and second opposite insulators positioned and axially slidable in the first and second shield cavities, respectively. The first and second opposite insulators form an insulator cavity extending along the housing. Finally, the electrical test probe assembly includes first and second opposite plungers positioned and axially slidable in the insulator cavity of the first and second opposite insulators and outwardly biased against each other.

Abstract: A double-headed spring contact probe for loaded board testing including a barrel having a hollow interior and opposite plungers which slide axially in the barrel is described. The plungers have outer portions which extend through the opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The keyway is disposed at an angle of about 6.degree. to the longitudinal axis thereof. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof and the keyway rides in the groove for electrical contact as translational movement occurs.

Abstract: A double-headed spring contact probe for loaded board testing includes a barrel having a hollow interior and opposite plungers which slide axially in the barrel. The plungers have outer portions which extend through opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof. A spring engages opposite collar portions of the plungers to bias the plungers outwardly against opposite ends of the barrel. Necked portions of the barrel limit travel of the plungers out from the barrel.