Abstract: A test connector for connection to two test inputs of a trip device. The test connector includes a fixed component made of electrically insulating material, wherein the fixed component includes a sleeve defining an inner space. A movable component is provided within the inner space and is axially movable therein. The movable component includes a protruding portion which extends from the fixed component. A spring is provided between the movable component and the fixed component to provide a biasing force to urge the movable component in an outward axial direction. Two testing needles are housed within two longitudinal passages within the movable component. Upon insertion of the test connector into a recessed portion of a face of an electronic trip device, the movable component is urged rearwardly to expose the two testing needles which pass through orifices int he recessed portion to contact the two test inputs of the trip device.