Patents by Inventor Paul DeANGELO

Paul DeANGELO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for conducting and real-time application of EC probe calibration
    Patent number: 9243883
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Grant
    Filed: March 27, 2014
    Date of Patent: January 26, 2016
    Assignee: OLYMPUS NDT, INC.
    Inventors: Xiangdeng Xu, Paul DeAngelo
  • APARATUS AND METHOD FOR CONDUCTING AND REAL-TIME APPLICATION OF EC PROBE CALIBRATION
    Publication number: 20150276371
    Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
    Type: Application
    Filed: March 27, 2014
    Publication date: October 1, 2015
    Applicant: Olympus NDT, Inc.
    Inventors: Xiangdeng XU, Paul DeANGELO