Abstract: The present invention concerns a device optimizing the coupling of two optical systems for the observation and analysis of objects, one of the systems producing the illumination of a point on the object being studied while the other produces the image of that point in an analyzer.The device is characterized by the fact that it contains a coupling optic 10 redirecting on the principal optical axis of the second system 12 a beam transmitted by the first system 11 even when the beam is located outside of the principal axis of that first system.Applicaiton is to spectral analysis, especially by microscope or telescope.

Abstract: An optical Raman microprobe with laser excitation for illuminating a sample, comprising means for illuminating the sample with a pulsed or continuous laser radiation of selected frequency, a microscope furnishing an enlarged image of the sample, means for selecting the wavelengths of the re-emitted or scattered light and means for detecting the selected light. The microprobe further comprises means for obtaining a micrographic image of the sample, to provide a map showing the distribution of a selected polyatomic species in the sample, by isolating a radiation characteristic of such species in the Raman, Stokes or anti-Stokes spectrum. All points of the sample may be illuminated simultaneously, or successively one after the other, or simultaneously along a selected line or curve.

Abstract: The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample.