Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: An elongated rectangular Rochon polarizer, e.g., having a height to width or depth ratio of at least 2.5, is securely held in a non-adhesive mounting assembly. The mounting assembly includes a plurality of compression elements that press the Rochon polarizer against corresponding reference points to properly align the Rochon polarizer within the mounting assembly. Moreover, air gaps between the Rochon polarizer and the sidewalls of the mounting assembly are provided to minimize thermal conduction between the mounting assembly and the Rochon polarizer and to provide thermal convection to cool the Rochon polarizer, thereby reducing risk of catastrophic delamination of the Rochon polarizer due to thermal effects.

Abstract: An oscilloscope probe includes: a connector pod; a probe identification module disposed in the connector pod, the probe identification module having a cross-sectional area; and a resistor disposed in the connector pod, and in-line with the probe identification module and having a substantially identical cross-sectional area as the probe identification module.

Abstract: A container for carrying contents therein and having a handle, and an article of commerce or blank for forming the container, is disclosed herein.

Abstract: An elongated rectangular Rochon polarizer, e.g., having a height to width or depth ratio of at least 2.5, is securely held in a non-adhesive mounting assembly. The mounting assembly includes a plurality of compression elements that press the Rochon polarizer against corresponding reference points to properly align the Rochon polarizer within the mounting assembly. Moreover, air gaps between the Rochon polarizer and the sidewalls of the mounting assembly are provided to minimize thermal conduction between the mounting assembly and the Rochon polarizer and to provide thermal convection to cool the Rochon polarizer, thereby reducing risk of catastrophic delamination of the Rochon polarizer due to thermal effects.

Abstract: A system for substrate tilt and focus control in an inspection system includes a dynamically actuatable substrate stage assembly including a substrate stage for securing a substrate; a tilt-height detection system including: a height detection sub-system and a tilt detection sub-system. The system further includes a first actuator configured to selectably actuate the substrate along a direction perpendicular to the surface of the substrate at a location of the substrate stage assembly; and an additional actuator configured to selectably actuate the substrate along a direction substantially perpendicular to the surface of the substrate at an additional location of the substrate stage assembly; and a MIMO tilt-focus controller communicatively coupled to the height detection sub-system, the tilt detection sub-system, the first actuator and the additional actuator.

Abstract: Disclosed herein is an apparatus for providing passive correction for thermal effects on a mounted mechanical component. Further disclosed is a wafer inspection system employing the passive thermal effect correction apparatus.

Abstract: A tool for investigating a substrate, where the tool has a tool head for investigating the substrate, a chuck for disposing an upper surface of the substrate in proximity to the tool head, and an air bearing disposed on the tool head adjacent the substrate. The air bearing has a pressure source and a vacuum source, where the vacuum source draws the substrate toward the air bearing and the pressure source prevents the substrate from physically contacting the air bearing. The pressure source and the vacuum source work in cooperation to dispose the upper surface of the substrate at a known distance from the tool head. By using the air bearing as part of the tool in this manner, registration of the substrate to the tool head is accomplished relative to the upper surface of the substrate, not the back side of the substrate.

Abstract: An automated service discovery and monitoring utility employs automatically generated policies (rules) for monitoring network health of a service based on network discovery using flow data derived from transmissions sent over segments between computing components defining the service. An interactive discovery application employs flow data based on transmissions associated with a service. Analysis of the flow data identifies associated components from inspection of the transmissions. Iterative component selection allows network traversal of components based on flow data of the segments used for providing the service.

Abstract: A system for substrate tilt and focus control in an inspection system includes a dynamically actuatable substrate stage assembly including a substrate stage for securing a substrate; a tilt-height detection system including: a height detection sub-system and a tilt detection sub-system. The system further includes a first actuator configured to selectably actuate the substrate along a direction perpendicular to the surface of the substrate at a location of the substrate stage assembly; and an additional actuator configured to selectably actuate the substrate along a direction substantially perpendicular to the surface of the substrate at an additional location of the substrate stage assembly; and a MIMO tilt-focus controller communicatively coupled to the height detection sub-system, the tilt detection sub-system, the first actuator and the additional actuator.

Abstract: A circuit for detection of an HDMI source device to an HDMI sink device through an HDMI sink connector without regard for the activity state of the HDMI source device has a pull-up resistor having first and second terminals with the first terminal coupled to a DC power source. A switching device is coupled between the pull-up resistor's second terminal and ground at a circuit node. The switching device is switched on to couple the circuit node to ground when power is applied to a control terminal thereof from the HDMI sink connector power pin, and being switched off otherwise. The circuit node is coupled to a DDC/CEC GROUND pin of the HDMI sink connector. The circuit node is readable as a binary signal to indicate the presence of a source device to the HDMI sink connector, wherein the node exhibits a logic low signal when either the node is grounded by the DDC/CEC GROUND pin connection to a source device or when the switching device is switched on.

Abstract: An automated service discovery and monitoring utility employs automatically generated policies (rules) for monitoring network health of a service based on network discovery using flow data derived from transmissions sent over segments between computing components defining the service. An interactive discovery application employs flow data based on transmissions associated with a service. Analysis of the flow data identifies associated components from inspection of the transmissions. Iterative component selection allows network traversal of components based on flow data of the segments used for providing the service.

Abstract: Disclosed herein is an apparatus for providing passive correction for thermal effects on a mounted mechanical component. Further disclosed is a wafer inspection system employing the passive thermal effect correction apparatus.

Abstract: A printing system is disclosed. The printing system includes a first printer to print a first barcode on a medium including variable to be printed on the medium and a second printer to print the variable data to the medium based on the first barcode and to print a second barcode to the medium for verification that the variable data has been accurately printed to the medium.

Abstract: The present invention is directed to a high speed, spinning chuck for use in a semiconductor wafer inspection system. The chuck of the present disclosure is configured with a turbulence-reducing lip. Spinning of the chuck produces radial airflows proximal to a surface of the wafer and proximal to the bottom of the chuck. The turbulence-reducing lip of the chuck of the present disclosure directs the radial airflows off of the top surface of the wafer and the bottom surface of the chuck in a manner that minimizes the size of the low pressure zone formed between these radial airflows. The minimization of the low pressure zone reduces air turbulence about the periphery of the chuck and substrate, thereby reducing the possibility of contaminants in the system being directed onto the surface of the substrate by such air turbulence.

Abstract: A printing system is disclosed. The printing system includes a first printer to print a first barcode on a medium including variable to be printed on the medium and a second printer to print the variable data to the medium based on the first barcode and to print a second barcode to the medium for verification that the variable data has been accurately printed to the medium.

Abstract: A printing system is disclosed. The printing system includes a first printer to print a first type of data to a medium and to print a first barcode on the medium including variable to be printed on the medium and a second printer to print the variable data to the medium based on the first barcode and to print a second barcode to the medium for verification that the variable data has been accurately printed to the medium.

Abstract: For accessing a database, a request attribute module constructs a request attribute list for a data value name received in a request block. The request attribute list associates the data value name with an attribute name and with a schema name. A schema name module adds the schema name from the request attribute list to a schema names list in response to the schema name not being included in the schema names list. An attribute name module adds the attribute name from the request attribute list to an attribute names list in response to the attribute name not being included in the attribute names list. A query build module builds a query statement directed to a target database from the schema names list and the attribute names list.