Abstract: A combined scanning probe and scanning energy microscope, in which the same scanning system is used for both the scanning probe and scanning energy images. A sample is translated substantially along a horizontal plane either between or below the probe of a scanning probe microscope and the objective of a scanning energy microscope. The probe collects topographic or other information. The objective focuses a fixed beam of energy to a small spot on the sample, then collects energy from the same spot and transmits it to a detector. A vertical translator connected to the probe or sample support provides the vertical motion necessary to maintain them in close proximity. The images produced by the two microscopes are in substantial direct registration with each other. The invention is exemplified by a combined atomic force and confocal laser scanning microscope with a translated sample.

Abstract: A near-field optical microscope and method of microscopy in which a probe including a flexible cantilever having a sharp tip is positioned in proximity to a sample. In one embodiment, a region of the sample is irradiated with light, and one or more portions of this region are caused to fluoresce. A quenching element is provided at the tip of the probe to quench the fluorescence of these portions within the region. The amount of quenching is determined while the sample is scanned to produce a high resolution image of the irradiated region of the sample. In another embodiment, the fluorescence imparted to one or more portions of the irradiated region is enhanced by the interaction of an optically active element disposed at the tip portion of the cantilever probe which provides for sharper images with greater signal-to-noise ratios.