Patents by Inventor Paul E. Janson

Paul E. Janson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing embedded RAM blocks by employing RAM scan techniques
    Patent number: 7287203
    Abstract: A method is provided for testing RAM blocks embedded in an integrated circuit. The method provides a scan circuit embedded in an integrated circuit. The scan circuit includes a RAM block, a plurality of first flip-flops each sending a read address to the RAM block, a plurality of second flip-flops each sending a write address to the RAM block, a plurality of third flip-flops each sending an enable signal to the RAM block, a plurality of fourth flip-flops, and a multiplexer receiving an output from the RAM block, the first, second, third and fourth flip-flops being connected in series. An internal scan test is performed by loading serial data into the first, second, third and fourth flip-flops.
    Type: Grant
    Filed: August 2, 2005
    Date of Patent: October 23, 2007
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Paul E. Janson