Patents by Inventor Paul E. Ohno

Paul E. Ohno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical quantification of interfacial charge states
    Patent number: 10514585
    Abstract: An apparatus for probing an interface via second harmonic generation (SHG) spectroscopy is provided.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: December 24, 2019
    Assignees: Northwestern University, Battelle Memorial Institute, The Trustees of Columbia University in the City of New York
    Inventors: Franz M. Geiger, Paul E. Ohno, Hong-fei Wang, Kenneth B. Eisenthal
  • OPTICAL QUANTIFICATION OF INTERFACIAL CHARGE STATES
    Publication number: 20190204712
    Abstract: Methods of generating second harmonic generation (SHG) signals from interfaces formed with, or formed over, a noncentrosymmetric material, e.g., ?-quartz, are provided. The methods make use of the noncentrosymmetric material as an internal phase reference for the determination of a variety of interfacial electrostatic parameters, including interfacial potential, interfacial charge density, and the sign of the interfacial charge (i.e., net positive or net negative).
    Type: Application
    Filed: March 12, 2019
    Publication date: July 4, 2019
    Applicant: Battelle Memorial Institute
    Inventors: Franz M. Geiger, Paul E. Ohno, Hong-fei Wang, Kenneth B. Eisenthal
  • Optical quantification of interfacial charge states
    Patent number: 10274807
    Abstract: Methods of generating second harmonic generation (SHG) signals from interfaces formed with, or formed over, a noncentrosymmetric material, e.g., ?-quartz, are provided. The methods make use of the noncentrosymmetric material as an internal phase reference for the determination of a variety of interfacial electrostatic parameters, including interfacial potential, interfacial charge density, and the sign of the interfacial charge (i.e., net positive or net negative).
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: April 30, 2019
    Assignees: Northwestern University, Battelle Memorial Institute, The Trustees of Columbia University in the City of New York
    Inventors: Franz M. Geiger, Paul E. Ohno, Hong-fei Wang, Kenneth B. Eisenthal
  • OPTICAL QUANTIFICATION OF INTERFACIAL CHARGE STATES
    Publication number: 20180164657
    Abstract: Methods of generating second harmonic generation (SHG) signals from interfaces formed with, or formed over, a noncentrosymmetric material, e.g., ?-quartz, are provided. The methods make use of the noncentrosymmetric material as an internal phase reference for the determination of a variety of interfacial electrostatic parameters, including interfacial potential, interfacial charge density, and the sign of the interfacial charge (i.e., net positive or net negative).
    Type: Application
    Filed: December 7, 2017
    Publication date: June 14, 2018
    Inventors: Franz M. Geiger, Paul E. Ohno, Hong-fei Wang, Kenneth B. Eisenthal