Abstract: An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.

Abstract: An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.

Abstract: A system employs physical unclonable functions of an integrated circuit for detecting integrated circuits and protecting products and technology from integrated circuits which have been subject to tampering, stressing and replacement, and counterfeit components. The system includes a sensor detecting a characteristic impedance generated as a result of controlled access to a memory device of the integrated circuit. The characteristic impedance is applied in the creation of a discrimination matrix of values based on electrical interface signals for the integrated circuit. The sensor includes a ring oscillator and associated monitoring components. The ring oscillator is composed of the memory device of the integrated circuit and a sensory circuitry, wherein changes in a frequency generated by the ring oscillator is indicative of changes in circuitry.

Abstract: An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.

Abstract: An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.

Abstract: A system employs physical unclonable functions of an integrated circuit for detecting integrated circuits and protecting products and technology from integrated circuits which have been subject to tampering, stressing and replacement, and counterfeit components. The system includes a sensor detecting a characteristic impedance generated as a result of controlled access to a memory device of the integrated circuit. The characteristic impedance is applied in the creation of a discrimination matrix of values based on electrical interface signals for the integrated circuit. The sensor includes a ring oscillator and associated monitoring components. The ring oscillator is composed of the memory device of the integrated circuit and a sensory circuitry, wherein changes in a frequency generated by the ring oscillator is indicative of changes in circuitry.

Abstract: A data acquisition apparatus acquires sensor data indicative of an operational state of an external operational unit and provides the sensor data to a remote host. To achieve this functionality, the data acquisition apparatus utilizes memory, a first data interface, a second data interface, and logic. The first data interface is configured to receive sensor data that is indicative of an operational state of an external operational unit, and the second data interface is configured to communicate with a remote host. The logic is configured to store the sensor data in the memory and, when requested, to communicate the sensor data to the remote host via the first data interface.

Abstract: A detector for detecting a delta modulated signal includes a timing circuit, a counter and a decoder arranged to detect a delta modulated signal in electrically noisy environment. The timing circuit is used to provide a timing signal of a predetermined time interval over which the counter counts the transitions present in the delta modulated signal. The counter is used for counting the digital bit occurrences of the delta modulated signal within the predetermined time interval. The decoder responds to the timing signal and receives the count signals from the counter and provides a binary signal of first state when the count signal indicates the number of bit occurrences of the delta modulated signal is above a predetermined high level of count or below a predetermined number of low count and provides a binary signal of a second state when the count signal indicates that the number of the digital bit occurrences occur between the predetermined high level of count and the predetermined low level of count.