Abstract: A semiconductor wafer mass metrology method comprising: controlling the temperature of a semiconductor wafer by: detecting information relating to the temperature of the semiconductor wafer; and controlling cooling or heating of the semiconductor wafer based on the detected information relating to the temperature of the semiconductor wafer; wherein controlling the cooling or heating of the semiconductor wafer comprises controlling a duration of the cooling or heating of the semiconductor wafer; and subsequently loading the semiconductor wafer onto a measurement area of a semiconductor wafer mass metrology apparatus.

Abstract: A method includes emitting a laser including a plurality of laser points onto a surface of a conveyor belt, capturing a plurality of first images of the surface of the conveyor belt during a first cycle of the conveyor belt, creating a first three-dimensional image of the surface of the conveyor belt during the first cycle, each of a plurality of locations of the surface of the conveyor belt in the first three-dimensional image being assigned first position data, capturing a plurality of second images of the surface of the conveyor belt during a second cycle of the conveyor belt; creating a second three-dimensional image of the surface during the second cycle, each of the plurality of locations of the surface in the second three-dimensional image being assigned second position data; and determining whether a difference between the first and second position data exceeds a predetermined threshold.

Abstract: A play center is described that is formed from multiple interconnected, modular polygonal decking components attached to and receiving water from one or more monopoles. The monopoles contain pressurized water and includes ports for distributing water to various water features distributed around the play center. Monoliths are attached to one or more sides of each of the decking components and are comprised of one or more panels and frame elements. The monoliths are removably connected to the decking components such that each monolith may be removed from one side of the decking and reconnected to another side of the decking, or be replaced with a different monolith. The play center also includes one or more elevated water control stations hidden within a monolith that allow for various adjustments to be made to the output of water to the water features of the play center.

Abstract: A method includes emitting a laser including a plurality of laser points onto a surface of a conveyor belt, capturing a plurality of first images of the surface of the conveyor belt during a first cycle of the conveyor belt, creating a first three-dimensional image of the surface of the conveyor belt during the first cycle, each of a plurality of locations of the surface of the conveyor belt in the first three-dimensional image being assigned first position data, capturing a plurality of second images of the surface of the conveyor belt during a second cycle of the conveyor belt; creating a second three-dimensional image of the surface during the second cycle, each of the plurality of locations of the surface in the second three-dimensional image being assigned second position data; and determining whether a difference between the first and second position data exceeds a predetermined threshold.

Abstract: A semiconductor wafer mass metrology method comprising: controlling the temperature of a semiconductor wafer by: detecting information relating to the temperature of the semiconductor wafer; and controlling cooling or heating of the semiconductor wafer based on the detected information relating to the temperature of the semiconductor wafer; wherein controlling the cooling or heating of the semiconductor wafer comprises controlling a duration of the cooling or heating of the semiconductor wafer; and subsequently loading the semiconductor wafer onto a measurement area of a semiconductor wafer mass metrology apparatus.

Abstract: A pressurising system for bolt tensioning, comprising: an inlet for receiving compressed gas; a fluid outlet for connection to a bolt tensioning device; a pump for pumping fluid for increasing the pressure at the fluid outlet, the pump being coupled to the inlet for being driven by compressed gas received at the inlet; a negative pressure generator coupled to the outlet for decreasing the pressure at the fluid outlet, the negative pressure generator being coupled to the inlet for being driven by compressed gas received at the inlet.