Patents by Inventor Paul-Henri Albarede

Paul-Henri Albarede has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Retention test system and method for resistively switching memory devices
    Patent number: 7715258
    Abstract: A retention test system and method for resistively switching memory devices is disclosed. One embodiment provides a plurality of memory cells configured to be changed over between a first state of high electrical resistance and a second state of low electrical resistance, wherein the system is configured to apply a bias voltage to at least one memory cell of the memory device to be tested.
    Type: Grant
    Filed: December 21, 2007
    Date of Patent: May 11, 2010
    Assignees: Qimonda AG, Altis Semiconductor
    Inventors: Ralf Symanczyk, Paul-Henri Albarede, Christelle Albarede, legal representative
  • RETENTION TEST SYSTEM AND METHOD FOR RESISTIVELY SWITCHING MEMORY DEVICES
    Publication number: 20090161460
    Abstract: A retention test system and method for resistively switching memory devices is disclosed. One embodiment provides a plurality of memory cells configured to be changed over between a first state of high electrical resistance and a second state of low electrical resistance, wherein the system is configured to apply a bias voltage to at least one memory cell of the memory device to be tested.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 25, 2009
    Applicants: QIMONDA AG, ALTIS SEMICONDUCTOR
    Inventors: Ralf Symanczyk, Paul-Henri Albarede