Patents by Inventor Paul Horn

Paul Horn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220364433
    Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.
    Type: Application
    Filed: July 31, 2022
    Publication date: November 17, 2022
    Inventors: Stephen Edmund Bruce, David Michael Shand, Tristam Paul Horn
  • Patent number: 11448037
    Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: September 20, 2022
    Assignee: Deltatek Oil Tools Limited
    Inventors: Stephen Edmund Bruce, David Michael Shand, Tristam Paul Horn
  • Patent number: 11433735
    Abstract: A control system and method for a heating system of an electric vehicle or hybrid vehicle is embodied such that when there is a heating request for a high-voltage accumulator, an HVA heating mode is activated in which the high-voltage accumulator which is connected to an HVA circuit of the heating system is heated by an HVA heating source which is activated for this purpose so that heat is generated in the HVA circuit or transferred into the circuit. When there is a heating request for a passenger compartment of the vehicle, an air-conditioning heating mode is activated in which the passenger compartment is heated by a heating circuit, with heat which is generated in the heating circuit with an auxiliary heater or is transferred into the heating circuit with a heat pump, or both.
    Type: Grant
    Filed: March 19, 2020
    Date of Patent: September 6, 2022
    Assignee: Bayerische Motoren Werke Aktiengesellschaft
    Inventors: Christian Allgaeuer, Paul Christ, Oliver Horn, Dominik Moser, Patrick Oswald, Andreas Siuka
  • Patent number: 11437218
    Abstract: System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.
    Type: Grant
    Filed: September 14, 2020
    Date of Patent: September 6, 2022
    Assignee: Massachusetts Institute of Technology
    Inventors: Richard C. Lanza, Berthold Klaus Paul Horn, Akintunde I. Akinwande, George Barbastathis, Rajiv Gupta
  • Publication number: 20220268127
    Abstract: A well construction method, and corresponding apparatus, in which a drilled bore (106) is lined with a plurality of successively smaller diameter sections of bore-lining tubing includes at least one casing (108, 110, 112) and at least one liner (120). The well construction method comprises: drilling a final section of a bore (106) to intersect a hydrocarbon-bearing formation (130); providing a shoe (134) at a distal end of a liner and a running tool (150) at a proximal end of the liner, and coupling an inner string (140) between the shoe (134) and the miming tool (150); running the liner (120) into the final section of the bore (106) such that the liner extends into the hydrocarbon-bearing formation (130); pumping a settable material (116) from surface (104), through the inner string (140), and through the shoe (134) to at least partially fill an outer annulus (114) surrounding the liner (120); and retrieving the inner string (140) and the running tool (150).
    Type: Application
    Filed: August 13, 2020
    Publication date: August 25, 2022
    Applicant: DELTATEK OIL TOOLS LIMITED
    Inventors: Tristam Paul Horn, Stephen Edmund Bruce, David Michael Shand
  • Patent number: 11372927
    Abstract: A method, a system, and a computer program product for executing a query in a database system. A query plan for execution of a query is generated. The query requires access to at least one table stored in a database system. One or more occurrences of one or more duplicate predicates is detected in the query plan. In response to detecting a first occurrence of the duplicate predicates, one or more intermediate query execution results responsive to the duplicate predicates are generated. The generated intermediate query execution results are cached. Query execution results incorporating cached intermediate query execution results being responsive to each occurrence of the duplicate predicates subsequent to the first occurrence of the duplicate predicates in the query plan are generated.
    Type: Grant
    Filed: April 4, 2019
    Date of Patent: June 28, 2022
    Assignee: SAP SE
    Inventors: Oliver Horn, Till Merker, Paul Willems
  • Patent number: 11152130
    Abstract: System and method for imaging an integrated circuit (IC). The imaging system comprises an x-ray source including a plurality of spatially and temporally addressable electron sources, an x-ray detector arranged such that incident x-rays are oriented normal to an incident surface of the x-ray detector and a three-axis stage arranged between the x-ray source and the x-ray detector, the three-axis stage configured to have mounted thereon an integrated circuit through which x-rays generated by the x-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the three-axis stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the three-axis stage to acquire a set of intensity data by the x-ray detector as the three-axis stage moves along a three-dimensional trajectory.
    Type: Grant
    Filed: August 15, 2017
    Date of Patent: October 19, 2021
    Assignee: Massachusetts Institute of Technology
    Inventors: Akintunde I. Akinwande, Berthold Klaus Paul Horn, Richard C. Lanza, George Barbastathis, Rajiv Gupta, Jonah Jacob
  • Patent number: 11145431
    Abstract: System and method for nanoscale X-ray imaging of biological specimen. The imaging system comprises an X-ray source including a plurality of spatially and temporally addressable electron sources, an X-ray detector arranged such that incident X-rays are oriented normal to an incident surface of the X-ray detector and a stage arranged between the X-ray source and the X-ray detector, the stage configured to have mounted thereon a biological specimen through which X-rays generated by the X-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the stage to acquire a set of intensity data by the X-ray detector as the stage moves along a three-dimensional trajectory.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: October 12, 2021
    Assignee: Massachusetts Institute of Technology
    Inventors: Richard C. Lanza, Berthold Klaus Paul Horn, Akintunde I. Akinwande, George Barbastathis, Rajiv Gupta
  • Patent number: 11111755
    Abstract: Downhole apparatus comprises: a tubular body for mounting on an inner tubing string (10); a first flow port (24); a second flow port (12a); and a connector (68) associated with the tubular body (10) and operable to at least one of engage with and disengage from a lower end (22) of a bore-lining tubing string (20). The apparatus has a first configuration in which the first flow port (24) is open and the second flow port (12a) is closed, whereby a settable material (54) may be pumped in a first direction (56) downwards through the tubular body, through the connector, and through the first flow port, and a second configuration in which the first flow port (24) is closed and the second flow port (12a) is open, whereby a fluid may be pumped in the first direction (58) downwards through the tubular body (10), exit the tubular body through the second flow port (12a), and then flow in a second direction upwards and externally of the tubular body.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: September 7, 2021
    Assignee: DeltaTek Oil Tools Limited
    Inventors: Stephen Edmund Bruce, David Michael Shand, Tristam Paul Horn
  • Publication number: 20210151288
    Abstract: System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.
    Type: Application
    Filed: September 14, 2020
    Publication date: May 20, 2021
    Applicant: Massachusetts Institute of Technology
    Inventors: Richard C. Lanza, Berthold Klaus Paul Horn, Akintunde I. Akinwande, George Barbastathis, Rajiv Gupta
  • Publication number: 20210087905
    Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.
    Type: Application
    Filed: August 1, 2018
    Publication date: March 25, 2021
    Inventors: Stephen Edmund Bruce, David Michael Shand, Tristam Paul Horn
  • Publication number: 20200263533
    Abstract: Downhole apparatus comprises: a tubular body for mounting on an inner tubing string (10); a first flow port (24); a second flow port (12a); and a connector (68) associated with the tubular body (10) and operable to at least one of engage with and disengage from a lower end (22) of a bore-lining tubing string (20). The apparatus has a first configuration in which the first flow port (24) is open and the second flow port (12a) is closed, whereby a settable material (54) may be pumped in a first direction (56) downwards through the tubular body, through the connector, and through the first flow port, and a second configuration in which the first flow port (24) is closed and the second flow port (12a) is open, whereby a fluid may be pumped in the first direction (58) downwards through the tubular body (10), exit the tubular body through the second flow port (12a), and then flow in a second direction upwards and externally of the tubular body.
    Type: Application
    Filed: August 1, 2018
    Publication date: August 20, 2020
    Inventors: Stephen Edmund Bruce, David Michael Shand, Tristam Paul Horn
  • Publication number: 20200085392
    Abstract: System and method for nanoscale X-ray imaging of biological specimen. The imaging system comprises an X-ray source including a plurality of spatially and temporally addressable electron sources, an X-ray detector arranged such that incident X-rays are oriented normal to an incident surface of the X-ray detector and a stage arranged between the X-ray source and the X-ray detector, the stage configured to have mounted thereon a biological specimen through which X-rays generated by the X-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the stage to acquire a set of intensity data by the X-ray detector as the stage moves along a three-dimensional trajectory.
    Type: Application
    Filed: November 14, 2019
    Publication date: March 19, 2020
    Applicant: Massachusetts Institute of Technology
    Inventors: Richard C. Lanza, Berthold Klaus Paul Horn, Akintunde I. Akinwande, George Barbastathis, Rajiv Gupta
  • Patent number: 10563973
    Abstract: A system is configured to perform metrology on a front surface, a back surface opposite the front surface, and/or an edge between the front surface and the back surface of a wafer. This can provide all wafer metrology and/or metrology of thin films on the back surface of the wafer. In an example, the thickness and/or optical properties of a thin film on a back surface of a wafer can be determined using a ratio of a greyscale image of a bright field light emerging from the back surface of the wafer under test to that of a reference wafer.
    Type: Grant
    Filed: September 2, 2016
    Date of Patent: February 18, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Shifang Li, Lena Nicolaides, Paul Horn, Richard Graetz
  • Publication number: 20190206652
    Abstract: System and method for imaging an integrated circuit (IC). The imaging system comprises an x-ray source including a plurality of spatially and temporally addressable electron sources, an x-ray detector arranged such that incident x-rays are oriented normal to an incident surface of the x-ray detector and a three-axis stage arranged between the x-ray source and the x-ray detector, the three-axis stage configured to have mounted thereon an integrated circuit through which x-rays generated by the x-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the three-axis stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the three-axis stage to acquire a set of intensity data by the x-ray detector as the three-axis stage moves along a three-dimensional trajectory.
    Type: Application
    Filed: August 15, 2017
    Publication date: July 4, 2019
    Applicants: Massachusetts Institute of Technology, Science Reseach Laboratory, Inc.
    Inventors: Akintunde I. Akinwande, Berthold Klaus Paul Horn, Richard C. Lanza, George Barbastathis, Rajiv Gupta, Jonah Jacob
  • Patent number: 10317344
    Abstract: Systems and methods for height measurements, such as those for bumps, pillars, or film thickness, can use chromatic confocal techniques. The system can include a white light source that emits white light and lenses that vary a focal distance of each wavelength of the white light from the white light source. Each of the wavelengths of the white light focuses at a different distance from the lenses. A sensor body has multiple sensors that are disposed in the sensor body in multiple rows and columns. Each of the rows and the columns has at least two of the sensors.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: June 11, 2019
    Assignee: KLA-Tencor Corporation
    Inventor: Paul Horn
  • Publication number: 20180067058
    Abstract: Systems and methods for height measurements, such as those for bumps, pillars, or film thickness, can use chromatic confocal techniques. The system can include a white light source that emits white light and lenses that vary a focal distance of each wavelength of the white light from the white light source. Each of the wavelengths of the white light focuses at a different distance from the lenses. A sensor body has multiple sensors that are disposed in the sensor body in multiple rows and columns. Each of the rows and the columns has at least two of the sensors.
    Type: Application
    Filed: August 30, 2017
    Publication date: March 8, 2018
    Inventor: Paul Horn
  • Patent number: 9885656
    Abstract: This semiconductor inspection and metrology system includes a knife-edge mirror configured to receive light reflected from a wafer. The knife-edge mirror is positioned at a focal point of the light reflected from the wafer such that the reflective film on the knife-edge mirror is configured to block at least some of the light reflected from the wafer. The portion of blocked light changes when the light reflected from the wafer is under-focused or over-focused. At least one sensor receives the light reflected from the wafer. Whether the light is under-focused or over-focused can be determined using a reading from the at least one sensor. A height of an illuminated region on the surface of the wafer can be determined using such a reading from the at least one sensor.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: February 6, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Shifang Li, Paul Horn
  • Publication number: 20170278236
    Abstract: A system is configured to perform metrology on a front surface, a back surface opposite the front surface, and/or an edge between the front surface and the back surface of a wafer. This can provide all wafer metrology and/or metrology of thin films on the back surface of the wafer. In an example, the thickness and/or optical properties of a thin film on a back surface of a wafer can be determined using a ratio of a greyscale image of a bright field light emerging from the back surface of the wafer under test to that of a reference wafer.
    Type: Application
    Filed: September 2, 2016
    Publication date: September 28, 2017
    Inventors: Shifang Li, Lena Nicolaides, Paul Horn, Richard Graetz
  • Patent number: 9752992
    Abstract: Field curvature of an optical system is modified based on topography of the surface of a wafer such that an image of each of the segments of the surface is in focus across the segment. The wafer may be non-planar. The optical system may be a multi-element lens system connected to a controller that modifies the field curvature by changing position of the lens elements. The wafer may be held by a chuck, such as an edge grip chuck. Multiple optical systems may be arranged across a dimension of the wafer.
    Type: Grant
    Filed: March 19, 2015
    Date of Patent: September 5, 2017
    Assignee: KLA-Tencor Corporation
    Inventor: Paul Horn