Abstract: A button for a drug delivery device with a reduced operating loudness includes a plate-like button body forming a touch surface, wherein the plate-like button body is coupled by an axial supporting member to a noise-generating interface of the drug delivery device and movable into a longitudinal direction of the drug delivery device, wherein the plate-like button body includes a material composite with at least one first component consisting of a first material and at least one second component consisting of a second material different from the first material, wherein the at least one first component and the at least one second component are coupled via at least one coupling plane that is at least sectionwise slanted or perpendicular to the longitudinal direction. Further, the disclosure describes a button assembly for a drug delivery device which is shock resistant.

Abstract: A coupling connects an inner string to a lower end of a bore-lining tubing, such as a liner. The coupling includes a catcher and may be provided in combination with at least one member for translating through the inner string and landing in the catcher. The member may be an occluding member, such as a ball for occluding a flow passage through the coupling.

Abstract: A method of locating bore-lining tubing, such as a liner (120), in a drilled bore (106) comprises selecting a buoyant material, such as air (138), having a density lower than the density of an ambient fluid, such as well fluid (180, 182). The buoyant material (138) and an inner tubing (140) are located within the bore-lining tubing (120) with the inner tubing (140) extending from a distal end of the bore-lining tubing to a proximal end of the bore-lining tubing. The inner tubing (140) is sealed to the distal end of the bore-lining tubing (120) and to a portion of the bore-lining tubing (120) spaced from the distal end to define an inner annulus (152) between the inner tubing (140) and the bore-lining tubing (120). A volume of the buoyant material (138) is retained within the inner annulus (152). An assembly (168) comprising the inner tubing (140) and the bore-lining tubing (120) and containing the volume of buoyant material (138) is run into a drilled bore (106).

Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.

Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.

Abstract: System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.

Abstract: A well construction method, and corresponding apparatus, in which a drilled bore (106) is lined with a plurality of successively smaller diameter sections of bore-lining tubing includes at least one casing (108, 110, 112) and at least one liner (120). The well construction method comprises: drilling a final section of a bore (106) to intersect a hydrocarbon-bearing formation (130); providing a shoe (134) at a distal end of a liner and a running tool (150) at a proximal end of the liner, and coupling an inner string (140) between the shoe (134) and the miming tool (150); running the liner (120) into the final section of the bore (106) such that the liner extends into the hydrocarbon-bearing formation (130); pumping a settable material (116) from surface (104), through the inner string (140), and through the shoe (134) to at least partially fill an outer annulus (114) surrounding the liner (120); and retrieving the inner string (140) and the running tool (150).

Abstract: System and method for imaging an integrated circuit (IC). The imaging system comprises an x-ray source including a plurality of spatially and temporally addressable electron sources, an x-ray detector arranged such that incident x-rays are oriented normal to an incident surface of the x-ray detector and a three-axis stage arranged between the x-ray source and the x-ray detector, the three-axis stage configured to have mounted thereon an integrated circuit through which x-rays generated by the x-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the three-axis stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the three-axis stage to acquire a set of intensity data by the x-ray detector as the three-axis stage moves along a three-dimensional trajectory.

Abstract: System and method for nanoscale X-ray imaging of biological specimen. The imaging system comprises an X-ray source including a plurality of spatially and temporally addressable electron sources, an X-ray detector arranged such that incident X-rays are oriented normal to an incident surface of the X-ray detector and a stage arranged between the X-ray source and the X-ray detector, the stage configured to have mounted thereon a biological specimen through which X-rays generated by the X-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the stage to acquire a set of intensity data by the X-ray detector as the stage moves along a three-dimensional trajectory.

Abstract: Downhole apparatus comprises: a tubular body for mounting on an inner tubing string (10); a first flow port (24); a second flow port (12a); and a connector (68) associated with the tubular body (10) and operable to at least one of engage with and disengage from a lower end (22) of a bore-lining tubing string (20). The apparatus has a first configuration in which the first flow port (24) is open and the second flow port (12a) is closed, whereby a settable material (54) may be pumped in a first direction (56) downwards through the tubular body, through the connector, and through the first flow port, and a second configuration in which the first flow port (24) is closed and the second flow port (12a) is open, whereby a fluid may be pumped in the first direction (58) downwards through the tubular body (10), exit the tubular body through the second flow port (12a), and then flow in a second direction upwards and externally of the tubular body.

Abstract: System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.

Abstract: A method of conditioning a well bore featuring an annulus (50) between a bore-lining tubing (20) and a surrounding bore wall (110) comprises pumping conditioning fluid through an inner tubing (10) located within the bore-lining tubing (20) and into a portion of the well bore containing the bore-lining tubing to affect the temperature of the portion of the well bore containing the bore-lining tubing. The annulus (50) between the bore-lining tubing (20) and the surrounding bore wall (110) is at least partially filled with settable material (54). The affected temperature of the portion of the well bore containing the bore-lining tubing influences the setting of the settable material. For example, heating the bore may accelerate setting of the material, while cooling the bore may retard setting of the material.

Abstract: Downhole apparatus comprises: a tubular body for mounting on an inner tubing string (10); a first flow port (24); a second flow port (12a); and a connector (68) associated with the tubular body (10) and operable to at least one of engage with and disengage from a lower end (22) of a bore-lining tubing string (20). The apparatus has a first configuration in which the first flow port (24) is open and the second flow port (12a) is closed, whereby a settable material (54) may be pumped in a first direction (56) downwards through the tubular body, through the connector, and through the first flow port, and a second configuration in which the first flow port (24) is closed and the second flow port (12a) is open, whereby a fluid may be pumped in the first direction (58) downwards through the tubular body (10), exit the tubular body through the second flow port (12a), and then flow in a second direction upwards and externally of the tubular body.

Abstract: System and method for nanoscale X-ray imaging of biological specimen. The imaging system comprises an X-ray source including a plurality of spatially and temporally addressable electron sources, an X-ray detector arranged such that incident X-rays are oriented normal to an incident surface of the X-ray detector and a stage arranged between the X-ray source and the X-ray detector, the stage configured to have mounted thereon a biological specimen through which X-rays generated by the X-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the stage to acquire a set of intensity data by the X-ray detector as the stage moves along a three-dimensional trajectory.

Abstract: A system is configured to perform metrology on a front surface, a back surface opposite the front surface, and/or an edge between the front surface and the back surface of a wafer. This can provide all wafer metrology and/or metrology of thin films on the back surface of the wafer. In an example, the thickness and/or optical properties of a thin film on a back surface of a wafer can be determined using a ratio of a greyscale image of a bright field light emerging from the back surface of the wafer under test to that of a reference wafer.

Abstract: System and method for imaging an integrated circuit (IC). The imaging system comprises an x-ray source including a plurality of spatially and temporally addressable electron sources, an x-ray detector arranged such that incident x-rays are oriented normal to an incident surface of the x-ray detector and a three-axis stage arranged between the x-ray source and the x-ray detector, the three-axis stage configured to have mounted thereon an integrated circuit through which x-rays generated by the x-ray source pass during operation of the imaging system. The imaging system further comprises at least one controller configured to move the three-axis stage during operation of the imaging system and selectively activate a subset of the electron sources during movement of the three-axis stage to acquire a set of intensity data by the x-ray detector as the three-axis stage moves along a three-dimensional trajectory.

Abstract: Systems and methods for height measurements, such as those for bumps, pillars, or film thickness, can use chromatic confocal techniques. The system can include a white light source that emits white light and lenses that vary a focal distance of each wavelength of the white light from the white light source. Each of the wavelengths of the white light focuses at a different distance from the lenses. A sensor body has multiple sensors that are disposed in the sensor body in multiple rows and columns. Each of the rows and the columns has at least two of the sensors.

Abstract: Systems and methods for height measurements, such as those for bumps, pillars, or film thickness, can use chromatic confocal techniques. The system can include a white light source that emits white light and lenses that vary a focal distance of each wavelength of the white light from the white light source. Each of the wavelengths of the white light focuses at a different distance from the lenses. A sensor body has multiple sensors that are disposed in the sensor body in multiple rows and columns. Each of the rows and the columns has at least two of the sensors.

Abstract: This semiconductor inspection and metrology system includes a knife-edge mirror configured to receive light reflected from a wafer. The knife-edge mirror is positioned at a focal point of the light reflected from the wafer such that the reflective film on the knife-edge mirror is configured to block at least some of the light reflected from the wafer. The portion of blocked light changes when the light reflected from the wafer is under-focused or over-focused. At least one sensor receives the light reflected from the wafer. Whether the light is under-focused or over-focused can be determined using a reading from the at least one sensor. A height of an illuminated region on the surface of the wafer can be determined using such a reading from the at least one sensor.

Abstract: A system is configured to perform metrology on a front surface, a back surface opposite the front surface, and/or an edge between the front surface and the back surface of a wafer. This can provide all wafer metrology and/or metrology of thin films on the back surface of the wafer. In an example, the thickness and/or optical properties of a thin film on a back surface of a wafer can be determined using a ratio of a greyscale image of a bright field light emerging from the back surface of the wafer under test to that of a reference wafer.