Abstract: An apparatus and method are provided for testing integrated circuits. An integrated circuit arrangement is provided having first and second dice. Each die has circuitry for diagnostic testing in response to a diagnostic test signal. The circuitry further defines an input for receiving the diagnostic test signal and an output for transmitting results of the diagnostic testing for each of the dice. Interconnecting circuitry between the dice transmits the diagnostic test signal transmitted to the first die to the second die before the diagnostic testing is completed in the first die.

Abstract: A method and apparatus are provided for performing on-board, in-circuit, and/or wafer level scan-based testing of integrated circuits. With the apparatus and method, one or more sequential storage elements, e.g., flip/flops, are coupled to combinational logic and are configured to have an additional port for receiving a scan mode signal. The scan mode signal sets the sequential storage element into one of two modes of operation: static mode in which the sequential storage element's output does not change on a falling edge of a scan enable signal or a transitional mode in which the sequential storage element's output is permitted to change on the falling edge. With sequential storage elements configured in this manner, a configuration scan is performed to set certain ones of the sequential storage elements into a static mode and other sequential storage elements into a transitional mode. A test pattern is then applied to the sequential storage elements and a pattern capture cycle is commenced.

Abstract: A method and an apparatus for a hardware/firmware trap. At least one set of a firmware code is executed for operation of the device. Modification to the operation of the device is performed. The modification to the operation comprises: receiving a patch code; creating a firmware trap; generating an interrupt in response to the firmware trap; and executing the patch code in response to the interrupt.

Abstract: A scan-cell for use in a scan device of the type which is utilized to test integrated circuits comprises a first multiplexer, a switching device, and a second multiplexer. The first multiplexer provides a data signal on the output thereof when a control signal is in a first state and provides a test signal at the output thereof when the control signal is in a second state. The switching device is coupled to the output of the first multiplexer and captures the output. The second multiplexer has an input coupled to the output of the switching device and transmits the output when the control signal is in the first state. The second multiplexer transmits an inverted form of the output when the control signal is in the second state.