Patents by Inventor Paul J. Drake, Jr.

Paul J. Drake, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7110956
    Abstract: A capability predictor that comprises a database 15 of capability of multiple designs is disclosed. The process capability data includes costs, quality, cycle time, and performance models. The process owner (expert) provides the data. The developer inputs equations necessary to calculate the predictions based in the selected design characteristics and the user selects the design. A processor 11 calculates the prediction based on the selected design and a display, such as monitor 11a or printer 16, displays the results of the predictions.
    Type: Grant
    Filed: May 28, 1996
    Date of Patent: September 19, 2006
    Assignee: Texas Instruments Incorporated
    Inventors: Paul J. Drake, Jr., Richard W. Johnson, Michael J. Kelly, Michael D. King, Clifford M. Polo
  • Patent number: 7024263
    Abstract: A mechanical tolerance method which links mechanical assembly tolerancing requirements to part variation controls. The method optimizes tolerance for a design. The method begins by a user defining an assembly requirement. Next, datum features are defined. The method then moves to the step of assigning component dimensions. A dimensional loop diagram is generated for each component. Next, an appropriate analysis/allocation method for determining tolerances of the components is determined. Upon selecting the appropriate process, variation controls are applied to the plurality of components. Next, tolerances are assigned to features of the components.
    Type: Grant
    Filed: July 25, 2003
    Date of Patent: April 4, 2006
    Inventors: Paul J. Drake, Jr., Dale L. Van Wyk
  • Patent number: 5581466
    Abstract: A method of providing tolerancing of an assembly of parts comprising the steps of querying and storing in a processor storage a mean dimension of the parts of the assembly, a sensitivity for each mean dimension, a fixed tolerance for the parts for which the user cannot change and a standard deviation for which the user can change. The method further includes the step of processing said mean dimension, said sensitivity, said tolerances, and said standard deviation to provide projected defects per unit and directions to or other information to achieve design goals.
    Type: Grant
    Filed: May 12, 1994
    Date of Patent: December 3, 1996
    Assignee: Texas Instruments Incorporated
    Inventors: Dale L. Van Wyk, Paul J. Drake, Jr.