Patents by Inventor Paul J. L. WEBSTER

Paul J. L. WEBSTER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230036545
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Application
    Filed: August 29, 2022
    Publication date: February 2, 2023
    Inventor: Paul J.L. Webster
  • Publication number: 20230016054
    Abstract: Systems, methods and apparatuses are used for monitoring material processing using imaging signal density calculated for an imaging beam directed to a workpiece or processing region, for example, during inline coherent imaging (ICI). The imaging signal density may be used, for example, to monitor laser and e-beam welding processes such as full or partial penetration welding. In some examples, the imaging signal density is indicative of weld penetration as a result of reflections from a keyhole floor and/or from a subsurface structure beneath the keyhole. The monitoring may include, for example, automated pass/fail or quality assessment of the welding or material processing or parts produced thereby. The imaging signal density may also be used to control the welding or material processing, for example, using imaging signal density data as feedback. The imaging signal density may be used alone or together with other measurements or metrics, such as distance or depth measurements.
    Type: Application
    Filed: September 30, 2022
    Publication date: January 19, 2023
    Inventors: Christopher M. Galbraith, Jordan Kanko, Paul J.L. Webster, Cole Van Vlack, Genevieve Elizabeth Hayes
  • Patent number: 11534858
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: December 27, 2022
    Assignee: IPG PHOTONICS CORPORATION
    Inventors: Paul J. L. Webster, James M. Fraser, Victor X. D. Yang
  • Patent number: 11458566
    Abstract: Systems, methods and apparatuses are used for monitoring material processing using imaging signal density calculated for an imaging beam directed to a workpiece or processing region, for example, during inline coherent imaging (ICI). The imaging signal density may be used, for example, to monitor laser and e-beam welding processes such as full or partial penetration welding. In some examples, the imaging signal density is indicative of weld penetration as a result of reflections from a keyhole floor and/or from a subsurface structure beneath the keyhole. The monitoring may include, for example, automated pass/fail or quality assessment of the welding or material processing or parts produced thereby. The imaging signal density may also be used to control the welding or material processing, for example, using imaging signal density data as feedback. The imaging signal density may be used alone or together with other measurements or metrics, such as distance or depth measurements.
    Type: Grant
    Filed: December 19, 2019
    Date of Patent: October 4, 2022
    Assignee: IPG PHOTONICS CORPORATION
    Inventors: Christopher M. Galbraith, Jordan Kanko, Paul J. L. Webster, Cole Van Vlack, Genevieve Elizabeth Hayes
  • Patent number: 11426816
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Grant
    Filed: April 24, 2020
    Date of Patent: August 30, 2022
    Assignee: IPG PHOTONICS CORPORATION
    Inventor: Paul J. L. Webster
  • Patent number: 11327011
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser, sintering, and welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Grant
    Filed: January 21, 2021
    Date of Patent: May 10, 2022
    Assignee: IPG PHOTONICS CORPORATION
    Inventors: Jordan Kanko, Paul J. L. Webster, James M. Fraser
  • Publication number: 20210323086
    Abstract: Systems and methods for static and dynamic calibration may be used to provide alignment of a measurement beam from a coherence imaging (CI) measurement system relative to a processing beam from a material processing system. In these systems and methods, a calibration measurement output may be obtained from the CI measurement system and/or from an auxiliary sensor. Future measurements performed by the CI measurement system may be modified based on, at least in part, the calibration measurement output.
    Type: Application
    Filed: April 16, 2021
    Publication date: October 21, 2021
    Inventors: Jordan A. Kanko, Hui-Chi Chen, Moemen Y. Moemen, Paul J.L. Webster
  • Publication number: 20210178513
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Application
    Filed: February 8, 2021
    Publication date: June 17, 2021
    Inventors: Paul J.L. Webster, James M. Fraser, Victor X.D. Yang
  • Publication number: 20210138579
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser, sintering, and welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Application
    Filed: January 21, 2021
    Publication date: May 13, 2021
    Inventors: Jordan Kanko, Paul J.L. Webster, James M. Fraser
  • Patent number: 10913130
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: February 9, 2021
    Assignee: IPG PHOTONICS CORPORATION
    Inventors: Paul J. L. Webster, James M. Fraser, Victor X. D. Yang
  • Patent number: 10898969
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser, sintering, and welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: January 26, 2021
    Assignee: IPG PHOTONICS CORPORATION
    Inventors: Jordan Kanko, Paul J. L. Webster, James M. Fraser
  • Publication number: 20200246911
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Application
    Filed: April 24, 2020
    Publication date: August 6, 2020
    Inventor: Paul J.L. Webster
  • Publication number: 20200198050
    Abstract: Systems, methods and apparatuses are used for monitoring material processing using imaging signal density calculated for an imaging beam directed to a workpiece or processing region, for example, during inline coherent imaging (ICI). The imaging signal density may be used, for example, to monitor laser and e-beam welding processes such as full or partial penetration welding. In some examples, the imaging signal density is indicative of weld penetration as a result of reflections from a keyhole floor and/or from a subsurface structure beneath the keyhole. The monitoring may include, for example, automated pass/fail or quality assessment of the welding or material processing or parts produced thereby. The imaging signal density may also be used to control the welding or material processing, for example, using imaging signal density data as feedback. The imaging signal density may be used alone or together with other measurements or metrics, such as distance or depth measurements.
    Type: Application
    Filed: December 19, 2019
    Publication date: June 25, 2020
    Inventors: Christopher M. Galbraith, Jordan Kanko, Paul J.L. Webster, Cole Van Vlack, Genevieve Elizabeth Hayes
  • Patent number: 10654126
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: May 19, 2020
    Assignee: IPG PHOTONICS CORPORATION
    Inventor: Paul J. L. Webster
  • Publication number: 20200023461
    Abstract: A system and method may be used to monitor and/or control material processing where a process beam is moved in a wobble pattern, such as a wobble-welding process. While at least one process beam is moved according to a wobble pattern on a processing site (e.g., a weld site) of a workpiece, an ICI system moves an imaging beam at least partially independently of the process beam to one or more measurement locations on the wobble pattern and obtains ICI measurements (e.g., depth measurements) at those locations. The ICI measurement(s) may be used, for example, to evaluate keyhole and/or melt pool characteristics during a welding process. Although the present application describes wobble welding processes, the systems and methods described herein may also be used with other material processing applications where a laser or other energy beam is wobbled or dithered during processing including, without limitation, additive manufacturing, marking and material removal.
    Type: Application
    Filed: July 18, 2019
    Publication date: January 23, 2020
    Inventors: Christopher M. Galbraith, Jordan A. Kanko, Paul J.L. Webster
  • Publication number: 20190299327
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Application
    Filed: April 12, 2019
    Publication date: October 3, 2019
    Inventor: Paul J.L. Webster
  • Patent number: 10413995
    Abstract: A method, apparatus, and system are provided to monitor and characterize the dynamics of a phase change region (PCR) created during laser welding, specifically keyhole welding, and other material modification processes, using low-coherence interferometry. By directing a measurement beam to multiple locations within and overlapping with the PCR, the system, apparatus, and method are used to determine, in real time, spatial and temporal characteristics of the weld such as keyhole depth, length, width, shape and whether the keyhole is unstable, closes or collapses. This information is important in determining the quality and material properties of a completed finished weld. It can also be used with feedback to modify the material modification process in real time.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: September 17, 2019
    Assignee: IPG PHOTONICS CORPORATION
    Inventor: Paul J. L. Webster
  • Patent number: 10124410
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser, sintering, and welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Grant
    Filed: January 18, 2017
    Date of Patent: November 13, 2018
    Assignee: IPG Photonics Corporation
    Inventors: Jordan Kanko, Paul J.L. Webster, James M. Fraser, Victor X.D. Yang
  • Publication number: 20180297117
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser, sintering, and welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Application
    Filed: June 13, 2018
    Publication date: October 18, 2018
    Applicant: IPG Photonics Corporation
    Inventors: Jordan Kanko, Paul J.L. Webster, James M. Fraser
  • Publication number: 20180290235
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Application
    Filed: June 13, 2018
    Publication date: October 11, 2018
    Inventors: Paul J.L. Webster, James M. Fraser, Victor X.D. Yang