Patents by Inventor Paul J. Murphy

Paul J. Murphy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150046757
    Abstract: Identifying an inter-relationship between performance metrics of a computer system. It is proposed to convert performance metric signals, which represent variations of performance metrics over time, into quantized signals having a set of allowable discrete values. The quantized signals are compared to detect a correlation based on the timing of variations quantized signals. An inter-relationship between the performance metrics may then be identified based on a detected correlation between the quantized signals.
    Type: Application
    Filed: August 11, 2014
    Publication date: February 12, 2015
    Inventors: Anthony T. Brew, Laura Flores Sánchez, Paul J. Murphy, Michele Palmia, Anthony W. Ward
  • Patent number: 8914085
    Abstract: A superconducting fault current limiter (SCFCL) includes a cryogenic tank defining an interior volume, a superconductor disposed in the interior volume, and a voltage detector configured to detect a voltage drop across the superconductor and provide a voltage signal representative of the voltage drop. This voltage detector enables real time monitoring of a condition of the superconductor during steady state operation of the SCFCL. If the voltage drop exceeds an acceptable voltage drop, corrective action such as maintenance, repair, and/or replacement may be taken.
    Type: Grant
    Filed: June 8, 2012
    Date of Patent: December 16, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventor: Paul J. Murphy
  • Publication number: 20140323313
    Abstract: A new type of superconducting fault current limiter is disclosed, which can advantageously be used with high voltage transmission networks. The circuit is electrically connected to two terminals, which connect to the transmission network. The superconducting circuit is located within an enclosure or tank, which is electrically isolated from ground. Therefore, the voltage difference between the enclosure and the superconducting circuit, and between the enclosure and the terminals are significantly less than exist in current deployments. In some embodiments, the enclosure is electrically connected to one of the terminals, while in other embodiments, the enclosure is electrically isolated from the terminals. The circuit can be combined with other like circuits to address a wide range of current transmission network configurations.
    Type: Application
    Filed: July 7, 2014
    Publication date: October 30, 2014
    Inventors: Kasegn D. Takletsadik, Roger B. Fish, Paul J. Murphy
  • Patent number: 8804288
    Abstract: New techniques for limiting transmission of fault current are disclosed. In one particular exemplary embodiment, the technique may be realized with a new type of apparatus for limiting transmission of fault current. The apparatus may comprise: a first enclosure electrically decoupled from ground, such that the first enclosure is electrically isolated from ground potential; first and second terminals, at least one of which is electrically connected to first one or more current carrying lines; and a first superconducting circuit contained in the first enclosure, the first superconducting circuit electrically connected to the first and second terminals, wherein the first enclosure is maintained at same electrical potential as the first one or more current carrying lines.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: August 12, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Kasegn D. Tekletsadik, Roger B. Fish, Paul J. Murphy
  • Patent number: 8739396
    Abstract: Several embodiments of a novel technique for limiting transmission of fault current are disclosed. Current power distribution systems typically have an impedance, or reactor, on the output of the network equipment to limit current in the case of a fault condition. A low resistance switch, which changes its resistance in the presence of high current, is connected in parallel with this reactor. Thus, in normal operation, the current from the power generator bypasses the reactor, thereby minimizing power loss. However, in the presence of a fault, the resistance of the switch increases, forcing the current to pass through the reactor, thereby limiting the fault current.
    Type: Grant
    Filed: June 15, 2011
    Date of Patent: June 3, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventor: Paul J. Murphy
  • Patent number: 8718733
    Abstract: A superconducting fault current limiter recovery system includes a superconducting fault current limiter, a shunt electrically coupled in parallel with the superconducting fault current limiter, and a bypass path also electrically coupled in parallel with the superconducting fault current limiter. The bypass path enables a load current to flow through the bypass path during a bypass condition. Thus, load current may be quickly reestablished to serve loads after a fault condition via the bypass path while a superconductor of the superconductor fault current limiter has time to return to a superconducting state after the fault condition.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: May 6, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Paul J. Murphy, Gary E. Dickerson
  • Patent number: 8700109
    Abstract: Techniques for improving reliability of a superconducting fault current limiting system (SCFCL) are provided. In one particular exemplary embodiment, the techniques may be realized with a superconducting fault current limiting system (SCFCL) comprising: an input current lead and an output current lead, each current lead coupled to a power distribution/transmission network; a container; a superconductor contained in the container; a shunt disposed outside the container and in parallel with the superconductor; a cryogenic system configured to provide coolant into the container; and at least one sensor disposed near and configured to monitor at least one operating condition of at least one of the input current lead and the output current lead, the superconductor, and the shunt.
    Type: Grant
    Filed: June 11, 2012
    Date of Patent: April 15, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Mark R. Amato, Paul J. Murphy, Kasegn D. Tekletsadik
  • Patent number: 8654486
    Abstract: A SCFCL system includes a first SCFCL, a second SCFCL, and a controller configured to control at least one switch to couple the first SCFCL to a power line between an AC source and a load, and to electrically isolate the second SCFCL from the power line during a first operating mode when the first SCFCL is in service and the second SCFCL serves as a spare. During the first operating mode, the second SCFCL, may be maintained in a latent standby state or an immediate standby state. The second SCFCL may be automatically switched into service to provide for fault current protection in case the first SCFCL needs to be taken out of service for maintenance, repair, or replacement.
    Type: Grant
    Filed: March 12, 2012
    Date of Patent: February 18, 2014
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Mark R. Amato, Paul J. Murphy, James D. Strassner
  • Patent number: 8611056
    Abstract: A superconducting fault current limiter (SCFCL) includes a cryogenic tank defining an interior volume, a superconductor disposed in the interior volume, and a refrigeration system configured to adjust a temperature of the superconductor in response to a condition during a steady state operation of the SCFCL. A method of operating a SCFCL includes cooling a superconductor disposed within an interior volume of a cryogenic tank to a temperature less than a critical temperature of the superconductor, and adjusting the temperature of the superconductor in response to a condition during a steady state operation of the SCFCL.
    Type: Grant
    Filed: March 9, 2012
    Date of Patent: December 17, 2013
    Assignee: Varian Semiconductor Equipment Associates Inc.
    Inventors: Mark R. Amato, Paul J. Murphy, James D. Strassner
  • Publication number: 20130225414
    Abstract: Techniques for improving reliability of a superconducting fault current limiting system (SCFCL) are provided. In one particular exemplary embodiment, the techniques may be realized with a superconducting fault current limiting system (SCFCL) comprising: an input current lead and an output current lead, each current lead coupled to a power distribution/transmission network; a container; a superconductor contained in the container; a shunt disposed outside the container and in parallel with the superconductor; a cryogenic system configured to provide coolant into the container; and at least one sensor disposed near and configured to monitor at least one operating condition of at least one of the input current lead and the output current lead, the superconductor, and the shunt.
    Type: Application
    Filed: June 11, 2012
    Publication date: August 29, 2013
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventors: Mark R. Amato, Paul J. Murphy, Kasegn D. Tekletsadik
  • Publication number: 20130221979
    Abstract: Techniques for improving reliability of a superconducting fault current limiting system (SCFCL) are provided. In one particular exemplary embodiment, the technique may be realized as a method of improving a reliability of a superconducting fault current limiting system (SCFCL), the SCFCL system comprising a superconductor provided in a container. The method may comprise providing one or more sensors capable of detecting a fault current proximate to the superconductor; determining a change in the condition of the superconductor as a result of the fault current; and estimating the lifetime of the superconductor based on the change in the condition of the superconductor.
    Type: Application
    Filed: June 11, 2012
    Publication date: August 29, 2013
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCITES,INC.
    Inventors: Kasegn D. Tekletsadik, Paul J. Murphy, Mark R. Amato, James D. Strassner
  • Patent number: 8467158
    Abstract: A new type of superconducting fault current limiter is disclosed, which can advantageously be used with high voltage transmission networks. The circuit is electrically connected to two terminals, which connect to the transmission network. The superconducting circuit is located within an enclosure or tank, which is electrically isolated from ground. Therefore, the voltage difference between the enclosure and the superconducting circuit, and between the enclosure and the terminals are significantly less than exist in current deployments. In some embodiments, the enclosure is electrically connected to one of the terminals, while in other embodiments, the enclosure is electrically isolated from the terminals. The circuit can be combined with other like circuits to address a wide range of current transmission network configurations.
    Type: Grant
    Filed: June 18, 2010
    Date of Patent: June 18, 2013
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Kasegn D. Tekletsadik, Roger B. Fish, Paul J. Murphy
  • Publication number: 20120316070
    Abstract: A superconducting fault current limiter (SCFCL) includes a cryogenic tank defining an interior volume, a superconductor disposed in the interior volume, and a voltage detector configured to detect a voltage drop across the superconductor and provide a voltage signal representative of the voltage drop. This voltage detector enables real time monitoring of a condition of the superconductor during steady state operation of the SCFCL. If the voltage drop exceeds an acceptable voltage drop, corrective action such as maintenance, repair, and/or replacement may be taken.
    Type: Application
    Filed: June 8, 2012
    Publication date: December 13, 2012
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventor: Paul J. Murphy
  • Publication number: 20120316069
    Abstract: A superconducting fault current limiter recovery system includes a superconducting fault current limiter, a shunt electrically coupled in parallel with the superconducting fault current limiter, and a bypass path also electrically coupled in parallel with the superconducting fault current limiter. The bypass path enables a load current to flow through the bypass path during a bypass condition. Thus, load current may be quickly reestablished to serve loads after a fault condition via the bypass path while a superconductor of the superconductor fault current limiter has time to return to a superconducting state after the fault condition.
    Type: Application
    Filed: May 31, 2012
    Publication date: December 13, 2012
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC
    Inventors: Paul J. Murphy, Gary E. Dickerson
  • Patent number: 8329260
    Abstract: A substrate is implanted with a species to form a layer of microbubbles in the substrate. The species may be hydrogen or helium in some embodiments. The size at which the microbubbles are stable within the substrate is controlled. In one example, this is by cooling the substrate. In one embodiment, the substrate is cooled to approximately between ?150° C. and 30° C. This cooling also may reduce diffusion of the species in the substrate and will reduce surface roughness when the substrate is cleaved along the layer of microbubbles.
    Type: Grant
    Filed: July 29, 2008
    Date of Patent: December 11, 2012
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Julian G. Blake, Paul J. Murphy
  • Patent number: 8319196
    Abstract: A technique for low-temperature ion implantation is disclosed. In one particular exemplary embodiment, the technique may be realized as an apparatus for low-temperature ion implantation. The apparatus may comprise a pre-chill station located in proximity to an end station in an ion implanter; a cooling mechanism within the pre-chill station configured to cool a wafer from ambient temperature to a predetermined range less than ambient temperature; a loading assembly coupled to the pre-chill station and the end station; and a controller in communication with the loading assembly and the cooling mechanism to coordinate loading a wafer into the pre-chill station, cooling the wafer down to the predetermined temperature range before any ion implantation into the wafer, and loading the cooled wafer into the end station where the cooled wafer undergoes an ion implantation process.
    Type: Grant
    Filed: May 2, 2011
    Date of Patent: November 27, 2012
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Jonathan G. England, Steven R. Walther, Richard S. Muka, Julian G. Blake, Paul J. Murphy, Reuel B. Liebert
  • Publication number: 20120257313
    Abstract: A superconducting fault current limiter (SCFCL) includes a cryogenic tank defining an interior volume, a superconductor disposed in the interior volume, and a refrigeration system configured to adjust a temperature of the superconductor in response to a condition during a steady state operation of the SCFCL. A method of operating a SCFCL includes cooling a superconductor disposed within an interior volume of a cryogenic tank to a temperature less than a critical temperature of the superconductor, and adjusting the temperature of the superconductor in response to a condition during a steady state operation of the SCFCL.
    Type: Application
    Filed: March 9, 2012
    Publication date: October 11, 2012
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventors: Mark R. Amato, Paul J. Murphy, James D. Strassner
  • Publication number: 20120236440
    Abstract: A SCFCL system includes a first SCFCL, a second SCFCL, and a controller configured to control at least one switch to couple the first SCFCL to a power line between an AC source and a load, and to electrically isolate the second SCFCL from the power line during a first operating mode when the first SCFCL is in service and the second SCFCL serves as a spare. During the first operating mode, the second SCFCL, may be maintained in a latent standby state or an immediate standby state. The second SCFCL may be automatically switched into service to provide for fault current protection in case the first SCFCL needs to be taken out of service for maintenance, repair, or replacement.
    Type: Application
    Filed: March 12, 2012
    Publication date: September 20, 2012
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventors: Mark R. Amato, Paul J. Murphy, James D. Strassner
  • Publication number: 20110308078
    Abstract: Several embodiments of a novel technique for limiting transmission of fault current are disclosed. Current power distribution systems typically have an impedance, or reactor, on the output of the network equipment to limit current in the case of a fault condition. A low resistance switch, which changes its resistance in the presence of high current, is connected in parallel with this reactor. Thus, in normal operation, the current from the power generator bypasses the reactor, thereby minimizing power loss. However, in the presence of a fault, the resistance of the switch increases, forcing the current to pass through the reactor, thereby limiting the fault current.
    Type: Application
    Filed: June 15, 2011
    Publication date: December 22, 2011
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventor: Paul J. Murphy
  • Publication number: 20110207308
    Abstract: A technique for low-temperature ion implantation is disclosed. In one particular exemplary embodiment, the technique may be realized as an apparatus for low-temperature ion implantation. The apparatus may comprise a pre-chill station located in proximity to an end station in an ion implanter; a cooling mechanism within the pre-chill station configured to cool a wafer from ambient temperature to a predetermined range less than ambient temperature; a loading assembly coupled to the pre-chill station and the end station; and a controller in communication with the loading assembly and the cooling mechanism to coordinate loading a wafer into the pre-chill station, cooling the wafer down to the predetermined temperature range before any ion implantation into the wafer, and loading the cooled wafer into the end station where the cooled wafer undergoes an ion implantation process.
    Type: Application
    Filed: May 2, 2011
    Publication date: August 25, 2011
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventors: Jonathan G. ENGLAND, Steven R. Walther, Richard S. Muka, Julian Blake, Paul J. Murphy, Reuel B. Liebert