Abstract: An electronic device display may have pixels formed from crystalline semiconductor light-emitting diode dies, organic light-emitting diodes, or other pixel structures. The pixels may be formed on a display panel substrate. A display panel may extend continuously across the display or multiple display panels may be tiled in two dimensions to cover a larger display area. Interconnect substrates may have outwardly facing contacts that are electrically shorted to corresponding inwardly facing contacts such as inwardly facing metal pillars associated with the display panels. The interconnect substrates may be supported by glass layers. Integrated circuits may be embedded in the display panels and/or in the interconnect substrates. A display may have an active area with pixels that includes non-spline pixels in a non-spline display portion located above a straight edge of the display and spline pixel in a spline display portion located above a curved edge of the display.

Abstract: Techniques are provided that control the generation of test routes to improve the ability of a test system to isolate defects on programmable circuits. A test generator creates test routes that test the horizontal resources. In these test routes, the inputs of each circuit element are only connected to other circuit elements in the same row. Test routes are also generated to test the vertical resources. Each of theses test routes is allowed to make only one transition from between two different rows of circuit elements. The configuration generator includes a post processor that ensures all source drivers in the test routes connect to at least two sinks.

Abstract: An integrated circuit is provided that includes testing circuitry for testing input-output circuits. The integrated circuit contains input-output circuits that each have associated input-output pins and input and output buffers. Each input-output circuit has associated features such as a weak pull-up feature, a voltage clamp diode feature, a bus hold feature, an open-drain feature, a differential input termination resistance feature, and a single-ended/differential mode selection feature. An input-output feature control register receives input-output circuit feature selection instructions. The feature selection instructions contain feature selection bits whose values determine which of the input-output circuit features are enabled in a set of input-output circuits for testing on the integrated circuit. The feature selection instructions can selectively enable one or more input-output circuit features in each input-output circuit.

Abstract: Programmable circuits have a programmable interconnect structure that connects programmable circuit elements. Tests patterns can be automatically generated for the programmable circuit elements and interconnections on a programmable circuit. A connectivity graph represents programmable interconnections and functions as nodes. Tests routes are generated that connect the nodes in the connectivity graph between control points and observation points on the programmable circuit. The routes are grouped into configuration patterns that can be tested in one test cycle. Test vectors are then applied to the routes to determine if the interconnects and circuit functions are operable. Systems and methods of the present invention automatically create test patterns for a programmable circuit to reduce engineer time. The present invention also reduces test time and resources by increasing the number of interconnections and circuit elements tested in each configuration pattern.