Abstract: A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyzer (6) and has first and second phase-locked signal sources (SS1 & SS2) and at least two measurement receivers (18a, 18b). A phase meter (26) is provided. A reference signal (F0) is outputted at a first frequency from the first signal source (SS1). The second signal source (SS2) steps through a multiplicity of different test frequencies (nF0), being phase-locked with the reference signal (F0), which are applied in turn to a part of the measurement system. Measurements are taken, via the two measurement receivers (18a, 18b), of characteristics of the resulting signal at a measurement plane. The absolute phase of the signal at the measurement plane is also measured with the phase meter (26). Calibration data is generated which relates the characteristics of the signals as measured by the measurement system (6) and the absolute phase as measured with the phase meter (26).

Abstract: A method of calibrating a high frequency signal measurement system is described. The measurement system is in the form of a network analyser (6) and has first and second phase-locked signal sources (SS1 & SS2) and at least two measurement receivers (18a, 18b). A phase meter (26) is provided. A reference signal (F0) is outputted at a first frequency from the first signal source (SS1). The second signal source (SS2) steps through a multiplicity of different test frequencies (nF0), being phase-locked with the reference signal (F0), which are applied in turn to a part of the measurement system. Measurements are taken, via the two measurement receivers (18a, 18b), of characteristics of the resulting signal at a measurement plane. The absolute phase of the signal at the measurement plane is also measured with the phase meter (26). Calibration data is generated which relates the characteristics of the signals as measured by the measurement system (6) and the absolute phase as measured with the phase meter (26).

Abstract: An analyser for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator 240a is described. An active load pull circuit 201 is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified signal back to the DUT 206. The signal is modified by a signal processing circuit 237 in view of input signals x, y to control the magnitude gain and phase change effected by the feedback circuit 237. Thus, positive feedback loops are avoided and better control of the analyser is permitted. A network analyser, or other signal measuring device 242, logs the waveforms (from which s-parameters derived) observed at ports of the DUT 206, thereby allowing the behaviour of the DUT 206 under various load conditions to be analysed.

Abstract: An analyzer for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator (240a) is described. An active load pull circuit (201) is connected to the DUT 206, which receives an output signal from the DUT 206 and then feeds a modified signal back to the DUT 206. The signal is modified by a signal processing circuit (237) in view of input signals x, y to control the magnitude gain and phase change effected by the feedback circuit (237). Thus, positive feedback loops are avoided and better control of the analyzer is permitted. A network analyzer, or other signal measuring device (242), logs the waveforms (from which s-parameters derived) observed at ports of the DUT 206, thereby allowing the behavior of the DUT 206 under various load conditions to be analyzed.

Abstract: A method of measuring the response of an electronic device to a high frequency input signal is performed with an analyzer (1).

Abstract: A method of measuring the response of an electronic device to a high frequency input signal is performed with an analyzer (1).