Patents by Inventor Paul Lindquist

Paul Lindquist has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210221023
    Abstract: Optical additive manufacturing, including laser additive manufacturing systems, apparatus and methods using polymer derived ceramic build materials. Additive manufacturing build materials are made of polymer derived ceramic including SiOC, precures, cured materials, hard cured materials, and pyrolized materials. Polymer derived ceramic build materials are mixed with and used in conjunction with other build materials.
    Type: Application
    Filed: January 22, 2021
    Publication date: July 22, 2021
    Applicant: Melior Innovations, Inc.
    Inventors: Paul Lindquist, Wen Liao, Mark Land, Richard Landtiser
  • Publication number: 20190337842
    Abstract: A polymer derived ceramic glass paint, glass coating, and glass composite. SiOC based glass paints. SiOC liquid coatings for glass substrates. SiOC particles and pigments for use in and on glass substrates. Methods of coating glass with SiOC based glass paints. Composites having a layer of conductive SiOC glass paint.
    Type: Application
    Filed: December 4, 2018
    Publication date: November 7, 2019
    Applicant: Melior Innovations, Inc.
    Inventors: David Bening, Richard Landtiser, Douglas Dukes, Wen Liao, Paul Lindquist
  • Patent number: 7435323
    Abstract: An apparatus which can control thickness uniformity during deposition of conductive material from an electrolyte onto a surface of a semiconductor substrate is provided. The apparatus has an anode which can be contacted by the electrolyte during deposition of the conductive material, a cathode assembly including a carrier adapted to carry the substrate for movement during deposition, and a conductive element permitting electrolyte flow therethrough. A mask lies over the conductive element and has openings permitting electrolyte flow. The openings define active regions of the conductive element by which a rate of conductive material deposition onto the surface can be varied. A power source can provide a potential between the anode and the cathode assembly so as to produce the deposition. A deposition process is also disclosed, and uniform electroetching of conductive material on the semiconductor substrate surface can additionally be performed.
    Type: Grant
    Filed: June 18, 2004
    Date of Patent: October 14, 2008
    Assignee: Novellus Systems, Inc.
    Inventors: Bulent M. Basol, Paul Lindquist
  • Publication number: 20070176493
    Abstract: The present invention is a method and system for powering a patient monitoring system. The present invention is a modular patient monitoring system utilizing a bi-directional power bus to efficiently couple a multi-parameter acquisition device, a display and any number of expansion modules. Each coupled device includes a battery, enabling each device to send or receive power through the bi-directional bus. The method and system of the present invention utilizes power from any single battery or from any number of the batteries in the system, as charge is not transferred from one battery to another. The present invention allows for the batteries to charge when it is operated from AC mains derived power.
    Type: Application
    Filed: September 22, 2005
    Publication date: August 2, 2007
    Inventors: Roy Koski, David Schieble, James Gray, Alan Clapp, Paul Lindquist
  • Publication number: 20050133380
    Abstract: The present invention applies an electrochemical etching solution to a material layer, preferably a metal layer, disposed on a workpiece, in the presence of a current. This electrochemical etching solution supplies to the material on the substrate surface the species to form an intermediate compound on the surface that can be more easily mechanically removed as intermediate compound fragments than the material. By removing the intermediate compound fragments, the process allows more efficient use of the supplied current to form another layer of intermediate compound that can also be mechanically removed, rather than using the current to result in another compound on the surface of the material that eventually dissolves into the solution. In another aspect of the invention, such intermediate compound particulates are externally generated and used to mechanically remove the surface layer of the material.
    Type: Application
    Filed: November 22, 2004
    Publication date: June 23, 2005
    Inventors: Bulent Basol, Cyprian Uzoh, Paul Lindquist, Homayoun Talieh
  • Publication number: 20040231994
    Abstract: An apparatus which can control thickness uniformity during deposition of conductive material from an electrolyte onto a surface of a semiconductor substrate is provided. The apparatus has an anode which can be contacted by the electrolyte during deposition of the conductive material, a cathode assembly including a carrier adapted to carry the substrate for movement during deposition, and a conductive element permitting electrolyte flow therethrough. A mask lies over the conductive element and has openings permitting electrolyte flow. The openings define active regions of the conductive element by which a rate of conductive material deposition onto the surface can be varied. A power source can provide a potential between the anode and the cathode assembly so as to produce the deposition. A deposition process is also disclosed, and uniform electroetching of conductive material on the semiconductor substrate surface can additionally be performed.
    Type: Application
    Filed: June 18, 2004
    Publication date: November 25, 2004
    Applicant: NuTool Inc.
    Inventors: Bulent M. Basol, Paul Lindquist
  • Patent number: 6821409
    Abstract: The present invention applies an electrochemical etching solution to a material layer, preferably a metal layer, disposed on a workpiece, in the presence of a current. This electrochemical etching solution supplies to the material on the substrate surface the species to form an intermediate compound on the surface that can be more easily mechanically removed as intermediate compound fragments than the material. By removing the intermediate compound fragments, the process allows more efficient use of the supplied current to form another layer of intermediate compound that can also be mechanically removed, rather than using the current to result in another compound on the surface of the material that eventually dissolves into the solution. In another aspect of the invention, such intermediate compound particulates are externally generated and used to mechanically remove the surface layer of the material.
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: November 23, 2004
    Assignee: ASM-Nutool, Inc.
    Inventors: Bulent M. Basol, Cyprian E. Uzoh, Paul Lindquist, Homayoun Talieh
  • Patent number: 6802946
    Abstract: An apparatus which can control thickness uniformity during deposition of conductive material from an electrolyte onto a surface of a semiconductor substrate is provided. The apparatus has an anode which can be contacted by the electrolyte during deposition of the conductive material, a cathode assembly including a carrier adapted to carry the substrate for movement during deposition, and a conductive element permitting electrolyte flow therethrough. A mask lies over the conductive element and has openings permitting electrolyte flow. The openings define active regions of the conductive element by which a rate of conductive material deposition onto the surface can be varied. A power source can provide a potential between the anode and the cathode assembly so as to produce the deposition. A deposition process is also disclosed, and uniform electroetching of conductive material on the semiconductor substrate surface can additionally be performed.
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: October 12, 2004
    Assignee: NuTool Inc.
    Inventors: Bulent M. Basol, Paul Lindquist
  • Publication number: 20040140287
    Abstract: A method of removing unwanted edge copper from an edge region of a wafer is provided. The method is applied subsequent to an electrochemical process to deposit a copper layer on a surface of a wafer. The edge region, which has the unwanted edge copper, includes a front edge surface, a back edge surface and a bevel. During the removal as the wafer is rotated, a stream of etchant solution from a front edge nozzle is delivered to the front edge surface of the wafer while another stream is delivered to the back edge surface from a back edge nozzle. Rotational motion of the wafer directs the etchant, which is delivered by the front and back edge nozzles, to the bevel and thereby causing removal of the unwanted copper from the edge region of the wafer.
    Type: Application
    Filed: September 30, 2003
    Publication date: July 22, 2004
    Inventors: Jeffery Bogart, Rimma Volodarsky, Paul Lindquist, Bulent M. Basol
  • Publication number: 20030178319
    Abstract: The present invention applies an electrochemical etching solution to a material layer, preferably a metal layer, disposed on a workpiece, in the presence of a current. This electrochemical etching solution supplies to the material on the substrate surface the species to form an intermediate compound on the surface that can be more easily mechanically removed as intermediate compound fragments than the material. By removing the intermediate compound fragments, the process allows more efficient use of the supplied current to form another layer of intermediate compound that can also be mechanically removed, rather than using the current to result in another compound on the surface of the material that eventually dissolves into the solution. In another aspect of the invention, such intermediate compound particulates are externally generated and used to mechanically remove the surface layer of the material.
    Type: Application
    Filed: April 5, 2002
    Publication date: September 25, 2003
    Inventors: Bulent M. Basol, Cyprian E. Uzoh, Paul Lindquist, Homayoun Talieh
  • Patent number: 6413403
    Abstract: An apparatus capable of assisting in controlling an electrolyte flow and distribution of an electric field, a magnetic field, or an electromagnetic field in order to process a substrate is provided with improved fluid distribution. A support member having a top surface and a bottom surface contains at least one support member electrolyte channel. Each support member electrolyte channel forms a passage between the top surface and the bottom surface and allows the electrolyte to flow therethrough. A pad is attachable to the support member and contains at least one set of pad electrolyte channels also allowing for electrolyte flow therethrough to the substrate. Each support member electrolyte channel is connected to one set of pad electrolyte channels by fluid distribution structure. A method of assisting in control of the electrolyte flow and distribution of the electric field, the magnetic field, or the electromagnetic field, utilizing the apparatus, is also provided.
    Type: Grant
    Filed: July 21, 2000
    Date of Patent: July 2, 2002
    Assignee: NuTool Inc.
    Inventors: Paul Lindquist, Bulent Basol, Cyprian Uzoh, Homayoun Talieh
  • Publication number: 20020079230
    Abstract: An apparatus which can control thickness uniformity during deposition of conductive material from an electrolyte onto a surface of a semiconductor substrate is provided. The apparatus has an anode which can be contacted by the electrolyte during deposition of the conductive material, a cathode assembly including a carrier adapted to carry the substrate for movement during deposition, and a conductive element permitting electrolyte flow therethrough. A mask lies over the conductive element and has openings permitting electrolyte flow. The openings define active regions of the conductive element by which a rate of conductive material deposition onto the surface can be varied. A power source can provide a potential between the anode and the cathode assembly so as to produce the deposition. A deposition process is also disclosed, and uniform electroetching of conductive material on the semiconductor substrate surface can additionally be performed.
    Type: Application
    Filed: May 15, 2001
    Publication date: June 27, 2002
    Inventors: Bulent M. Basol, Paul Lindquist