Abstract: Systems and methods for allowing an Internet of Things device to circuit switch among embedded subscriber identity modules (eSIMs) are provided. A communication circuit for operating a plurality of eSIMs may include a first and second eSIM. The communication circuit may further include an eSIM card interface bus configured to provide signals to and from the eSIMs, the bus including a data line adapted to receive a data signal. The communication circuit may further include an eSIM select line configured to receive an eSIM select control signal to select between the eSIMs to communicate with a wireless network. The communication circuit may further include a selector connected to the eSIM select line, the selector adapted to switch the data signal between the first and second channel to provide the data signal to the first and second eSIMs based at least in part on the eSIM select control signal.

Abstract: In accordance with the claimed invention, there is provided an apparatus for changing an oxidation state of a surface to be analysed of a sample, the apparatus comprising: a vacuum chamber; a sample holder inside the vacuum chamber, configured to hold a sample having a surface to be analysed; an inlet inside the vacuum chamber, configured to provide a localised supply, to the surface to be analysed, of an agent for changing an oxidation state of the surface to be analysed; and an energy source, configured to provide energy to the agent to facilitate changing the oxidation state of the surface to be analysed. There is also provided a process for changing an oxidation state of a surface to be analysed of a sample and a process for performing X-ray photoelectron spectroscopy, XPS, of a surface to be analysed of a sample.

Abstract: A circuit element of a semiconductor device is provided. The circuit element has an electrical property and is formed by at least two like individual elements, each of said individual elements having an individual electrical property, the individual electrical property of each individual element including an error portion that is substantially statistically uncorrelated with regard to the other individual elements wherein the electrical property is a function of a summation of the individual electrical properties.

Abstract: According to a first embodiment of the present invention, reconfigurable resources within a reconfigurable test unit are configured to test or monitor a first function associated with a system under test. Following the completion of the testing or monitoring of the first function, the reconfigurable resources within the reconfigurable test unit are configured to test or monitor a second function associated with the system under test, wherein the second function may be substantially different than the first function. The method and apparatus so described allows for the testing of systems using a minimal amount of hardware and software resources within a reconfigurable test unit.

Abstract: A circuit element of a semiconductor device is provided. The circuit element has an electrical property and is formed by at least two like individual elements, each of said individual elements having an individual electrical property, the individual electrical property of each individual element including an error portion that is substantially statistically uncorrelated with regard to the other individual elements wherein the electrical property is a function of a summation of the individual electrical properties.

Abstract: A microwave component has a cavity including a plurality of geometrically shaped elements therein wherein the shape profile and position of the elements in relation to the cavity act to define the guiding properties of the cavity and therefore to define operational characteristics of the component.

Abstract: A semiconductor device has a circuit element having a given value of a characteristic property. The circuit element has at least two individual elements, each having an individual value for the characteristic value thereof, the individual values including an error portion that is substantially statistically uncorrelated, the individual elements disposed solely for contributing to the values of the characteristic property.

Abstract: A microwave component has a cavity including a plurality of geometrically shaped elements therein wherein the shape profile and position of the elements in relation to the cavity act to define the guiding properties of the cavity and therefore to define operational characteristics of the component.

Abstract: A microwave component has a cavity including a plurality of geometrically shaped elements therein wherein the shape profile and position of the elements in relation to the cavity act to define the guiding properties of the cavity and therefore to define operational characteristics of the component.

Abstract: A semiconductor device has a circuit element having a given value of a characteristic property. The circuit element has at least two individual elements, each having an individual value for the characteristic value thereof, the individual values including an error portion that is substantially statistically uncorrelated, the individual elements disposed solely for contributing to the values of the characteristic property.

Abstract: An E-plane waveguide is provided comprising a housing having opposed walls defining a waveguide channel. The waveguide includes at least two elements spaced apart in a direction along the waveguide channel and disposed between and spaced from the opposed walls, and which define a resonant cavity therebetween with the waveguide channel. At least one of the walls has first and second protrusions which are spaced apart in a direction along the waveguide channel and protrude into the waveguide channel. The spacing between the protrusions is less than half a wavelength of the resonant frequency of the resonant cavity.

Abstract: A microwave component has a cavity including a plurality of geometrically shaped elements therein wherein the shape profile and position of the elements in relation to the cavity act to define the guiding properties of the cavity and therefore to define operational characteristics of the component.

Abstract: An E-plane waveguide is provided comprising a housing having opposed walls defining a waveguide channel. The waveguide includes at least two elements spaced apart in a direction along the waveguide channel and disposed between and spaced from the opposed walls, and which define a resonant cavity therebetween with the waveguide channel. At least one of the walls has first and second protrusions which are spaced apart in a direction along the waveguide channel and protrude into the waveguide channel. The spacing between the protrusions is less than half a wavelength of the resonant frequency of the resonant cavity.