Abstract: Methods, systems and computer program products for countering the effects of four wave mixing are described. In one implementation, a controller can be used to shift an operating wavelength of an optical transmitter away from a zero-dispersion wavelength through which signals of the optical transmitter are transmitted. The controller can perform the shifting process while allowing sufficient margin for division multiplexing and minimal dispersion. The controller may determine an appropriate offset to be used for shifting the operating wavelength without subjecting the signals to a significant increase in undesirable effects such as dispersion, crosstalk and signal distortion which can impact the overall bit-error rate.

Abstract: Methods, systems and computer program products for countering the effects of four wave mixing are described. In one implementation, a controller can be used to shift an operating wavelength of an optical transmitter away from a zero-dispersion wavelength through which signals of the optical transmitter are transmitted. The controller can perform the shifting process while allowing sufficient margin for division multiplexing and minimal dispersion. The controller may determine an appropriate offset to be used for shifting the operating wavelength without subjecting the signals to a significant increase in undesirable effects such as dispersion, crosstalk and signal distortion which can impact the overall bit-error rate.

Abstract: Methods, systems and computer program products for countering the effects of four wave mixing are described. In one implementation, a controller can be used to shift an operating wavelength of an optical transmitter away from a zero-dispersion wavelength through which signals of the optical transmitter are transmitted. The controller can perform the shifting process while allowing sufficient margin for division multiplexing and minimal dispersion. The controller may determine an appropriate offset to be used for shifting the operating wavelength without subjecting the signals to a significant increase in undesirable effects such as dispersion, crosstalk and signal distortion which can impact the overall bit-error rate.

Abstract: A linearized external modulator transmitter with improved dynamic range includes a limiter and a subtractor, which each receive one or more time-varying input signals. The limiter generates a first signal with an amplitude that is confined to a range bounded by preset positive and negative levels, wherein, between the preset levels, the transmitter has an optical power output that is linearly related to the input signal. The first signal is passed through a predistortion circuit connected to an external modulator as well as into the subtractor, which generates a signal equal to the amount by which the input signal exceeds, either positively or negatively, the limited first signal. The subtractor sends the excess signal to a tunable gain circuit connected to a laser. The laser is connected to the external modulator, which generates the optical power output of the transmitter. The transmitter can be adapted to include dual sets of inputs--e.g.

Abstract: Electro-optical in-circuit testing, especially of large circuits such as those assembled on printed circuit boards, is achieved in an automatic test system by disposing an electro-optical sensor in proximity to the circuit conductors, applying test signals to the circuit under test, and measuring an optical property of the sensor at selected regions thereof corresponding to internal nodes, i.e. test points, of the circuit. The sensor may be an optical probe comprising a lens and a layer of electro-optical material which is adapted to be applied to the circuit. The electro-optical material may be either a polymer film or a crystal, the latter requiring a flexible coupling medium on the face applied to the circuit under test. The electro-optical material is provided with a reflective coating on one surface to facilitate a polarimetric measurement made transverse to the plane of the material.

Abstract: Electro-optical in-circuit testing, especially of large circuits such as those assembled on printed circuit boards, is achieved in an automatic test system by disposing an electro-optical sensor in proximity to the circuit conductors, applying test signals to the circuit under test, and measuring an optical property of the sensor at selected regions thereof corresponding to internal nodes, i.e. test points, of the circuit. The sensor may be an optical probe, having a lens and a layer of electro-optical material which is adapted to be applied to the circuit. The electro-optical material may be either a polymer film or a crystal, the latter requiring a flexible coupling medium on the face applied to the circuit under test. The electro-optical material is provided with a reflective coating on one surface to facilitate a polarimetric measurement made transverse to the plane of the material.

Abstract: The device of the invention comprises a main optical sensor (3) suitable for measuring a changing physical parameter, and a secondary optical sensor (6) suitable for measuring a disturbance which influences the measurement of said physical parameter, but for which the frequency spectrum is disjoint from that of the parameter. The sensors (3) and (6) are connected in series such that the main sensor serves to modulate the beam received by the secondary sensor.