Abstract: An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.

Abstract: An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.

Abstract: A microwave plasma apparatus for processing a material includes a plasma chamber, a microwave radiation source, and a waveguide guiding microwave radiation from the microwave radiation source to the plasma chamber. A process gas flows through the plasma chamber and the microwave radiation couples to the process gas to produce a plasma jet. A process material is introduced to the plasma chamber, becomes entrained in the plasma jet, and is thereby transformed to a stream of product material droplets or particles. The product material droplets or particles are substantially more uniform in size, velocity, temperature, and melt state than are droplets or particles produced by prior devices.

Abstract: A microwave plasma apparatus for processing a material includes a plasma chamber, a microwave radiation source, and a waveguide guiding microwave radiation from the microwave radiation source to the plasma chamber. A process gas flows through the plasma chamber and the microwave radiation couples to the process gas to produce a plasma jet. A process material is introduced to the plasma chamber, becomes entrained in the plasma jet, and is thereby transformed to a stream of product material droplets or particles. The product material droplets or particles are substantially more uniform in size, velocity, temperature, and melt state than are droplets or particles produced by prior devices.

Abstract: System for drilling boreholes into subsurface formations. A gyrotron injects millimeter-wave radiation energy into the borehole and pressurization apparatus is provided for pressurizing the borehole whereby a thermal melt front at the end of the borehole propagates into the subsurface formations. In another aspect, a system for fracturing a subsurface formation is disclosed.

Abstract: A milliwave melter monitoring system is presented that has a waveguide with a portion capable of contacting a molten material in a melter for use in measuring one or more properties of the molten material in a furnace under extreme environments. A receiver is configured for use in obtaining signals from the melt/material transmitted to appropriate electronics through the waveguide. The receiver is configured for receiving signals from the waveguide when contacting the molten material for use in determining the viscosity of the molten material. Other embodiments exist in which the temperature, emissivity, viscosity and other properties of the molten material are measured.

Abstract: Directed energy melter. The melter includes a vessel and structure for introducing waste material into the vessel. Waveguide structure is provided for introducing millimeter wave electromagnetic radiation into the vessel to heat the waste material. A gyrotron is a preferred source for the millimeter wave electromagnetic radiation.

Abstract: System for drilling boreholes into subsurface formations. A gyrotron injects millimeter-wave radiation energy into the borehole and pressurization apparatus is provided for pressurizing the borehole whereby a thermal melt front at the end of the borehole propagates into the subsurface formations. In another aspect, a system for fracturing a subsurface formation is disclosed.

Abstract: A milliwave melter monitoring system is presented that has a waveguide with a portion capable of contacting a molten material in a melter for use in measuring one or more properties of the molten material in a furnace under extreme environments. A receiver is configured for use in obtaining signals from the melt/material transmitted to appropriate electronics through the waveguide. The receiver is configured for receiving signals from the waveguide when contacting the molten material for use in determining the viscosity of the molten material. Other embodiments exist in which the temperature, emissivity, viscosity and other properties of the molten material are measured.

Abstract: In embodiments, spectroscopic monitor monitors modulated light signals to detect low levels of contaminants and other compounds in the presence of background interference. The monitor uses a spectrometer that includes a transmissive modulator capable of causing different frequency ranges to move onto and off of the detector. The different ranges can include those with the desired signal and those selected to subtract background contributions from those with the desired signal. Embodiments of the system are particularly useful for monitoring metal concentrations in combustion effluent.

Abstract: Pyrometer with a probe beam superimposed on its field-of-view for furnace temperature measurements. The pyrometer includes a heterodyne millimeter/sub-millimeter-wave or microwave receiver including a millimeter/sub-millimeter-wave or microwave source for probing. The receiver is adapted to receive radiation from a surface whose temperature is to be measured. The radiation includes a surface emission portion and a surface reflection portion which includes the probe beam energy reflected from the surface. The surface emission portion is related to the surface temperature and the surface reflection portion is related to the emissivity of the surface. The simultaneous measurement of surface emissivity serves as a real time calibration of the temperature measurement. In an alternative embodiment, a translatable base plate and a visible laser beam allow slow mapping out of interference patterns and obtaining peak values therefor.

Abstract: Microwave-induced plasma for continuous, real time trace element monitoring under harsh and variable conditions. The sensor includes a source of high power microwave energy and a shorted waveguide made of a microwave conductive, high temperature capability refractory material communicating with the source of the microwave energy to generate a plasma. The high power waveguide is constructed to be robust in a hot, hostile environment. It includes an aperture for the passage of gases to be analyzed and a spectrometer is connected to receive light from the plasma. Provision is made for real time in situ calibration. The spectrometer disperses the light, which is then analyzed by a computer. The sensor is capable of making continuous, real time quantitative measurements of desired elements, such as the heavy metals lead and mercury. The invention may be incorporated into a high temperature process device and implemented in situ for example, such as with a DC graphite electrode plasma arc furnace.

Abstract: Radiometer with a probe beam superimposed on its field-of-view for furnace temperature measurements. The radiometer includes a heterodyne millimeter/submillimeter-wave receiver including a millimeter/submillimeter-wave source for probing. The receiver is adapted to receive radiation from a surface whose temperature is to be measured. The radiation includes a surface emission portion and a surface reflection portion which includes the probe beam energy reflected from the surface. The surface emission portion is related to the surface temperature and the surface reflection portion is related to the emissivity of the surface. The simultaneous measurement of surface emissivity serves as a real time calibration of the temperature measurement.

Abstract: Microwave-induced plasma for continuous, real time trace element monitoring under harsh and variable conditions. The sensor includes a source of high power microwave energy and a shorted waveguide made of a microwave conductive, refractory material communicating with the source of the microwave energy to generate a plasma. The high power waveguide is constructed to be robust in a hot, hostile environment. It includes an aperture for the passage of gases to be analyzed and a spectrometer is connected to receive light from the plasma. Provision is made for real time in situ calibration. The spectrometer disperses the light, which is then analyzed by a computer. The sensor is capable of making continuous, real time quantitative measurements of desired elements, such as the heavy metals lead and mercury.

Abstract: The structures for confining or guiding high frequency electromagnetic radiation have surfaces facing the radiation constructed of high temperature superconducting materials, that is, materials having critical temperatures greater than approximately 35.degree. K. The use of high temperature superconductors removes the constraint of the relatively low energy gaps of conventional, low temperature superconductors which precluded their use at higher frequencies. The high temperature superconductors also provide larger thermal margins and more effective cooling. Devices which will benefit from the structures of the invention include microwave cavities, millimeter-wave/far infrared cavities, gyrotron cavities, mode converters, accelerators and free electron lasers, and waveguides.

Abstract: An apparatus and method for measurement of ohmic loss and surface resistivity is provided with a straight lumen waveguide with at least one opening at one end. Diffraction of radiation introduced to the lumen at one end of the tube provides feedback to establish resonances within the tube. Using the "whispering gallery" resonant modes maximizes the total ohmic loss and thereby enhances sensitivity of resistivity measurements. The angle at which resonant radiation exits the lumen is a function of the mode and size of the operative. Thus, preferred spatial detection allows enhancement of the device signal while discriminating against undesired modes. Selection of modes allows high frequency measurements, into the tetraherz range, to be made without disabling restrictions in the device dimensions, spatial input/output coupling or ohmic loss depending on alignment for analysis of, for example, high temperature superconductors.

Abstract: The structures for confining or guiding high frequency electromagnetic radiation have surfaces facing the radiation constructed of high temperature superconducting materials, that is, materials having critical temperatures greater than approximately 35.degree.K. The use of high temperature superconductors removes the constraint of the relatively low energy gaps of conventional, low temperature superconductors which precluded their use at high frequencies. The high temperature superconductors also provide larger thermal margins and more effective cooling. Devices which will benefit from the structures of the invention include microwave cavities, millimeter-wave/far infrared cavities, gyrotron cavities, mode converters, accelerators and free electron lasers, and waveguides.