Patents by Inventor Paul R. O'Hern, JR.

Paul R. O'Hern, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing quality improvement through statistical root cause analysis using convolution neural networks
    Patent number: 11803953
    Abstract: A quality improvement method for an image sensor array includes collecting in-line optical inspection data of the image sensor, collecting end of line electrical data of the image sensor, creating defect maps and obtaining x-y coordinates of the optical inspection data and the electrical data, correlating the defect maps to generate correlated defects, classifying the images of the correlated defects, and generating root cause statistics of the classified correlated defects.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: October 31, 2023
    Assignee: dpiX, LLC
    Inventors: Jerome David Crocco, Paul R. O'Hern, Jr.
  • Manufacturing Quality Improvement Through Statistical Root Cause Analysis Using Convolution Neural Networks
    Publication number: 20180293722
    Abstract: A quality improvement method for an image sensor array includes collecting in-line optical inspection data of the image sensor, collecting end of line electrical data of the image sensor, creating defect maps and obtaining x-y coordinates of the optical inspection data and the electrical data, correlating the defect maps to generate correlated defects, classifying the images of the correlated defects, and generating root cause statistics of the classified correlated defects.
    Type: Application
    Filed: March 28, 2018
    Publication date: October 11, 2018
    Inventors: Jerome David Crocco, Paul R. O'Hern, JR.