Abstract: An integrated circuit includes a region of logic circuits, first and second selector circuits, a first interface circuit for exchanging information with a first type of device according to a first communication protocol, and a second interface circuit for exchanging information with a second type of device according to a second communication protocol. The first selector circuit is configurable to provide signals between the region of the logic circuits and a selected one of the first or second interface circuits. The second selector circuit is configurable to provide signals between the selected one of the first or second interface circuits and the first or second type of device.

Abstract: An integrated circuit device is disclosed that includes an interposer and a programmable fabric die disposed on the interposer. The programmable fabric die includes multiple sectors that each have multiple rows of logic element blocks. Each row of logic element blocks includes multiple microbumps. Each logic element block has programmable fabric circuitry and an input/output interface electrically coupled to a respective microbump. The integrated circuit device also includes a device disposed on the interposer external to the programmable fabric die and electrically coupled to the microbumps via the interposer.

Abstract: An integrated circuit device is disclosed that includes an interposer and a programmable fabric die disposed on the interposer. The programmable fabric die includes multiple sectors that each have multiple rows of logic element blocks. Each row of logic element blocks includes multiple microbumps. Each logic element block has programmable fabric circuitry and an input/output interface electrically coupled to a respective microbump. The integrated circuit device also includes a device disposed on the interposer external to the programmable fabric die and electrically coupled to the microbumps via the interposer.

Abstract: Systems, methods, and apparatuses for error checking are disclosed. In one embodiment, an error checking system is used on a device that has a plurality of parallel data lanes as inputs. It may be desired to provide an error checking system with sufficient resolution to detect single-bit errors, determine how many bits are in error, and/or determine which bit(s) of a parallel data lane are in error. In one embodiment, the present disclosure provides for switchable error checking through the use of a multiplexor configured to select a particular data lane for error checking. This switchable error checking may provide benefits such as low cost, low power consumption, and/or low size.

Abstract: Systems, methods, and apparatuses for error checking are disclosed. In one embodiment, an error checking system is used on a device that has a plurality of parallel data lanes as inputs. It may be desired to provide an error checking system with sufficient resolution to detect single-bit errors, determine how many bits are in error, and/or determine which bit(s) of a parallel data lane are in error. In one embodiment, the present disclosure provides for switchable error checking through the use of a multiplexor configured to select a particular data lane for error checking. This switchable error checking may provide benefits such as low cost, low power consumption, and/or low size.