Abstract: A data processing apparatus is provided in which a processing unit, by means of a read access request, accesses a storage device which stores data values and error data associated with those data values. When the processing unit accesses a data value in the storage device, error detection circuitry detects if an error is present in that data value and, if necessary, error correction circuitry corrects the read data value. An error cache having at least one entry stores corrected replacement data values, a corrected data value being allocated into an entry of the error cache for every corrected data value that is generated, and the read access request is re-performed. Replacement data values are read from the error cache in preference to data values stored in the storage device. This ensures that the retry mechanism will succeed irrespective of whether the error was a soft error or a hard error.

Abstract: A data processing apparatus is provided comprising processing circuitry for performing data processing operations, a set associative storage device for storing data values for access by the processing circuitry when performing data processing operations, error detection circuitry for performing, for each access to the storage device, an error detection operation on the data value accessed, and maintenance circuitry associated with the storage device for performing one or more maintenance operations.

Abstract: A data processing apparatus comprising a plurality of data processors, each data processor comprising: first logic operable in a first clock domain and further logic operable in a second clock domain, said first and second clock domains being asynchronous with each other; a synchronizer operable to synchronize a signal processed by said first logic to produce a signal synchronized to said second clock domain; a synchronized signal output operable to export from said data processor said synchronized signal output from said synchronizer; and a signal input operable to import a signal to said data processor, said data processor being operable to route said imported signal to said further logic; wherein said plurality of data processors are arranged to operate in parallel with each other and said data processing apparatus further comprises: combining logic arranged to receive said exported synchronized signals from each of said plurality of data processors and to combine said exported synchronized signals to prod

Abstract: A memory 2 is formed having an array of memory cells 4 arranged in rows 14. An address decoder 6 generates a word line signal WL in response to an input address to select one of the rows of memory cells for access. The word line signal also accesses address identifying data associated with the row of memory cells being accessed. This address identifying data is compared with the input address by fault detection circuitry 10. If a mismatch is detected, then this indicates a fault within the address decoder 6.

Abstract: An integrated circuit and method for testing memory on that integrated circuit includes processing logic operable to perform data processing operations on data, and a number of memory units operable to store data for access by the processing logic. A memory test controller is also provided for executing test events in order to seek to detect any memory defects in the number of memory units. The controller includes a storage operable to store event defining information for each of a plurality of test events forming a sequence of test events to be executed, and an interface which, during a single programming operation, receives the event defining information for each of the plurality of test events and causes that event defining information to be stored in the storage. Event processing logic within the controller is then operable, following the single programming operation, to execute the sequence of test events.