Abstract: Systems and methods for attenuated total reflectance (ATR) spectroscopy. The systems and methods may generally involve differentiating an acquired image in a spectral domain, restricting a spectral range of the acquired image, subtracting an average absorbance from the restricted image data, and applying a principal component analysis to extract significant spectral features from the restricted image data.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage of the microscope. A mounting (100) for an ATR crystal (106) is carried on the support. A sample supporting member (60) is disposed below the location of the ATR crystal. The sample supporting member (60) has a relatively thin upper wall (64). A pressure applying mechanism (80) is located below the wall (64) and is operable to apply pressure to a sample through the wall (64) to ensure good contact between a sample and the sample contacting surface of the crystal.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be fixed to the moveable stage (20) of the microscope. A mounting member (100) is carried by the support (40). A sample supporting member (60) is disposed below the location of the ATR crystal (106). The sample supporting member (60) is carried on the support (40) such that it can be moved to restricted extent relative to the support and defines a sub-stage which can be moved relative to the main stage (20) of the microscope.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be fixed to the moveable stage (20) of the microscope. A mounting member (100) is carried by the support (40). A sample supporting member (60) is disposed below the location of the ATR crystal (106). The sample supporting member (60) is carried on the support (40) such that it can be moved to restricted extent relative to the support and defines a sub-stage which can be moved relative to the main stage (20) of the microscope.

Abstract: An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage of the microscope. A mounting (100) for an ATR crystal (106) is carried on the support. A sample supporting member (60) is disposed below the location of the ATR crystal. The sample supporting member (60) has a relatively thin upper wall (64). A pressure applying mechanism (80) is located below the wall (64) and is operable to apply pressure to a sample through the wall (64) to ensure good contact between a sample and the sample contacting surface of the crystal.