Abstract: A pipelined Analog-to-Digital Converter (ADC) stage includes a main sampling path having a first filter in series with a first sample and hold circuit and a sub-ADC sampling path having a second filter in series with a second sample and hold circuit driving a sub-ADC connected to a sub-Digital-to-Analog Converter (DAC). The frequency response of the main sampling path is matched to a frequency response of the sub-ADC sampling path such that a residue signal of the pipelined ADC stage stays within range.

Abstract: A pipelined Analog-to-Digital Converter (ADC) stage includes a main sampling path having a first filter in series with a first sample and hold circuit and a sub-ADC sampling path having a second filter in series with a second sample and hold circuit driving a sub-ADC connected to a sub-Digital-to-Analog Converter (DAC). The frequency response of the main sampling path is matched to a frequency response of the sub-ADC sampling path such that a residue signal of the pipelined ADC stage stays within range.

Abstract: A pipelined Analog-to-Digital Converter (ADC) includes circuitry to characterize capacitors associated with a Multiplying-Digital-to-Analog Converter (MDAC) of a stage of said pipelined ADC, said capacitors contributing to a gain of said pipelined ADC, circuitry to connect a subset of said capacitors not currently being characterized to reference signals of said pipelined ADC such that a residue signal of said stage stays within an input range of an instrument measuring said residue signal, circuitry to calculate said gain of said pipelined ADC using said capacitor characterizations, and an output adjusting component to digitally change an output of said pipelined ADC to compensate for said calculated gain.

Abstract: An analog-to-digital converter includes a comparator configured to receive a first input signal and a second input signal, in which at least one of the input signals is received between two transistors, each of the transistors being in common-gate configuration. A method for comparing input signals performed by a comparator circuit includes: receiving a first input signal between a drain terminal of a first transistor of the comparator circuit and a source terminal of a second transistor of the comparator circuit; receiving a second input signal; and outputting a value based on a comparison of the first input signal and the second input signal.

Abstract: A Digital-to-Analog Converter (DAC) with code independent output capacitance includes circuitry configured to convert a digital input signal to an analog output signal in a manner such that at least one output terminal of the DAC exhibits a constant capacitance value for up to all received values of the digital input signal. A method for converting a digital signal to an analog signal with a DAC includes converting a digital input signal to an analog output signal in a manner such that at least one output terminal of the DAC exhibits a constant capacitance value for up to all received values of the digital input signal.

Abstract: An analog-to-digital converter includes a comparator configured to receive a first input signal and a second input signal, in which at least one of the input signals is received between two transistors, each of the transistors being in common-gate configuration.

Abstract: A Digital-to-Analog Converter (DAC) with code independent output capacitance includes circuitry configured to convert a digital input signal to an analog output signal in a manner such that at least one output terminal of the DAC exhibits a constant capacitance value for up to all received values of the digital input signal. A method for converting a digital signal to an analog signal with a DAC includes converting a digital input signal to an analog output signal in a manner such that at least one output terminal of the DAC exhibits a constant capacitance value for up to all received values of the digital input signal.