Patents by Inventor Paul Tutzu

Paul Tutzu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11512982
    Abstract: A measuring arrangement for distance or angle measurement and a corresponding measuring method are described. In accordance with one example, the measuring arrangement comprises a scale having magnetization which varies along a measuring direction and which brings about a correspondingly varying magnetic field. The measuring device furthermore comprises at least one scanning head which is permeated by the varying magnetic field depending on the relative position with respect to the scale in the measuring direction. The scanning head comprises the following: at least one ferromagnetic film having, on account of the magneto impedance effect, a local electrical impedance that is dependent on the magnetic field and varies along the measuring direction, and at least one sensor unit configured to generate at least two phase-shifted sensor signals which are dependent on the local electrical impedance of the film.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: November 29, 2022
    Inventors: Victor Vasiloiu, Paul Tutzu
  • Publication number: 20220128380
    Abstract: A measuring arrangement for distance or angle measurement and a corresponding measuring method are described. In accordance with one example, the measuring arrangement comprises a scale having magnetization which varies along a measuring direction and which brings about a correspondingly varying magnetic field. The measuring device furthermore comprises at least one scanning head which is permeated by the varying magnetic field depending on the relative position with respect to the scale in the measuring direction. The scanning head comprises the following: at least one ferromagnetic film having, on account of the magneto impedance effect, a local electrical impedance that is dependent on the magnetic field and varies along the measuring direction, and at least one sensor unit configured to generate at least two phase-shifted sensor signals which are dependent on the local electrical impedance of the film.
    Type: Application
    Filed: October 9, 2018
    Publication date: April 28, 2022
    Inventors: Victor Vasiloiu, Paul Tutzu