Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: A partitioned network has several subdomains (1, 2, 3), each having a respective access server (10, 20, 30) and each serving a plurality of end users (11, 12; 21, 22; 31, 32). Each access server (10, 20, 30) is connected to a respective content cache (13, 23) or a set of such caches (130, 131, 132), which stores content and downloads it to end users on request. An alternative routing (19, 29) may be available between an access server (10) and a content cache (23) other than its associated cache (13), for use in exceptional circumstances. All the content caches (13, 23), are given the same IP address, “W.X.Y.Z”. Each access server (10, 20, 30) operates exclusively in a geographic sub-domain, and recognises the IP address W.X.Y.Z as relating uniquely to its respective associated content cache (13), (23, 23). This means that the configuration of each access server (10,20, 30) to handle content caching/distribution/streaming can be the same regardless of its location in the network.

Abstract: A partitioned network has several subdomains (1, 2, 3,) each having a respective access server (10, 20, 30) and each serving a plurality of end users (11, 12; 21, 22; 31, 32). Each access server (10, 20, 30) is connected to a respective content cache (13, 23) or a set of such caches (130, 131, 132), which stores content and downloads it to end users on request. An alternative routing (19, 29) may be available between an access server (10) and a content cache (23) other than its associated cache (13), for use in exceptional circumstances. All the content caches (13, 23), are given the same IP address, “W.X.Y.Z”. Each access server (10, 20, 30) operates exclusively in a geographic sub-domain, and recognises the IP address W.X.Y.Z as relating uniquely to its respective associated content cache 13, (23, 23) This means that the configuration of each access server (10, 20, 30) to handle content caching/distribution/streaming can be the same regardless of its location in the network.

Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.