Abstract: A mass spectrometer for producing a primary beam of ions for bombarding a sample under vacuum. The mass spectrometer includes a detector for detecting a secondary beam of ions released from the sample. The primary beam of ions includes water clusters where each water cluster contains between 1 and 10,000 water molecules. The primary beam of ions, in one embodiment, is produced by adiabatic expansion of water vapor. An auxiliary beam of ions for bombarding the sample includes a different species to those of the primary beam of ions.

Abstract: The present disclosure provides a mass spectrometer including means for producing a primary beam of ions for bombarding a sample under vacuum and a detector for detecting a secondary beam of ions released from the sample. The primary beam of ions includes a gaseous mixture of a cluster forming gas and one or more hydrogen-rich hydrocarbons.

Abstract: A mass spectrometer comprising means for producing a primary beam of ions for bombarding a sample under vacuum, and a detector for detecting a secondary beam of ions released from the sample. The primary beam of ions includes water clusters where each water cluster contains between 1 and 10,000 water molecules.

Abstract: The present invention relates to an apparatus and method for the analysis of ions in a mass spectrometer comprising; a means to remove material from the sample at a defined specific point, a means to change either discretely or continuously the said defined point of material removal, at least one ionisation means, at least one ion accelerator, at least one energy selective means, a time focus means, a pulse bunching means and a detection means. Said invention allows the mass of an to be analysed with respect to multiple positions on a sample of a material providing a method and apparatus that allows the effective three dimensional mapping of the sample in terms of its constituent parts, their corresponding distribution in those three dimensions in relation to each other and other points of interest on the said sample and also to retain important chemical information by permitting the analysis of whole and intact molecules present on the surface of or within the material sample.

Abstract: An apparatus and method for the presentation of organic samples at low temperature and under vacuum for analysis using a surface analysis technique is described. The apparatus carries a sample trapped between two hinged plates which is subsequently cryogenically-cooled and then inserted into a vacuum system where it locates on a cold stage. The device has a mechanism which is used to fracture the sample whilst under vacuum and open the two halves of the sample ready for analysis. It thus provides a reliable automated method of freeze-fracture, replacing current unreliable manual methods.