Patents by Inventor Paul Woskov
Paul Woskov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8748785Abstract: A microwave plasma apparatus for processing a material includes a plasma chamber, a microwave radiation source, and a waveguide guiding microwave radiation from the microwave radiation source to the plasma chamber. A process gas flows through the plasma chamber and the microwave radiation couples to the process gas to produce a plasma jet. A process material is introduced to the plasma chamber, becomes entrained in the plasma jet, and is thereby transformed to a stream of product material droplets or particles. The product material droplets or particles are substantially more uniform in size, velocity, temperature, and melt state than are droplets or particles produced by prior devices.Type: GrantFiled: January 17, 2008Date of Patent: June 10, 2014Assignees: Amastan LLC, University of ConnecticutInventors: Eric Jordan, Baki M. Cetegen, Kamal Hadidi, Paul Woskov
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Patent number: 8525085Abstract: The melter includes a vessel and structure for introducing waste material into the vessel. Waveguide structure is provided for introducing millimeter wave electromagnetic radiation into the vessel to heat the waste material. A gyrotron is a preferred source for the millimeter wave electromagnetic radiation.Type: GrantFiled: May 10, 2007Date of Patent: September 3, 2013Assignees: Massachusetts Institute of Technology, Battelle Memorial Institute, Inentec LLCInventors: Paul Woskov, S. Kamakshi Sundaram, Daniel Cohn, Jeffrey E. Surma, David A. Lamar
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Patent number: 7453566Abstract: Hybrid plasma monitor. A ground electrode is spaced apart from a high voltage electrode supporting an electric discharge therebetween to generate a plasma. The ground electrode and the high voltage electrode form an annular region into which a sample is introduced for generating a plasma. Microwave radiation couples into the plasma to sustain the plasma. A light detector such as a spectrometer receives light resulting from atomic emissions from the sample to analyze elements in the sample.Type: GrantFiled: August 31, 2006Date of Patent: November 18, 2008Assignee: Massachusetts Institute of TechnologyInventors: Kamal Hadidi, Paul Woskov
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Patent number: 7425248Abstract: A gas processing chamber for treating a gas stream containing an oxidant and carbon particles, having a gas inlet port for receiving the gas stream from a high temperature processing chamber, a gas outlet port for exhausting the processed gas stream, a microwave source for introducing microwave energy into the gas processing chamber having a sufficient power to induce the carbon to react with the oxidant, a microwave waveguide to direct the microwave energy at the gas stream for processing, a reflected microwave power dump for protecting the microwave source from reflected microwave power, and a window seal to separate the gas stream from the microwave source.Type: GrantFiled: June 12, 2000Date of Patent: September 16, 2008Assignee: Integrated Environmental Technologies, LLCInventors: Paul Woskov, David Y. Rhee, David A. Lamar, Jeffrey E. Surma
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Publication number: 20080173641Abstract: A microwave plasma apparatus for processing a material includes a plasma chamber, a microwave radiation source, and a waveguide guiding microwave radiation from the microwave radiation source to the plasma chamber. A process gas flows through the plasma chamber and the microwave radiation couples to the process gas to produce a plasma jet. A process material is introduced to the plasma chamber, becomes entrained in the plasma jet, and is thereby transformed to a stream of product material droplets or particles. The product material droplets or particles are substantially more uniform in size, velocity, temperature, and melt state than are droplets or particles produced by prior devices.Type: ApplicationFiled: January 17, 2008Publication date: July 24, 2008Inventors: Kamal Hadidi, Baki M. Cetegen, Eric Jordan, Paul Woskov
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Publication number: 20080055594Abstract: Hybrid plasma monitor. A ground electrode is spaced apart from a high voltage electrode supporting an electric discharge therebetween to generate a plasma. The ground electrode and the high voltage electrode form an annular region into which a sample is introduced for generating a plasma. Microwave radiation couples into the plasma to sustain the plasma. A light detector such as a spectrometer receives light resulting from atomic emissions from the sample to analyze elements in the sample.Type: ApplicationFiled: August 31, 2006Publication date: March 6, 2008Inventors: Kamal Hadidi, Paul Woskov
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Patent number: 6362449Abstract: High power microwave plasma torch. The torch includes a source of microwave energy which is propagated by a waveguide. The waveguide has no structural restrictions between the source of microwave energy and the plasma to effect resonance. The gas flows across the waveguide and microwave energy is coupled into the gas to create a plasma. At least 5 kilowatts of microwave energy is coupled into the gas. It is preferred that the waveguide be a fundamental mode waveguide or a quasi-optical overmoded waveguide. In one embodiment, the plasma torch is used in a furnace for heating a material within the furnace.Type: GrantFiled: August 12, 1998Date of Patent: March 26, 2002Assignee: Massachusetts Institute of TechnologyInventors: Kamal Hadidi, Paul Woskov
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Patent number: 6198293Abstract: The method for measuring the thickness of a material which transmits a detectable amount of microwave radiation includes irradiating the material with coherent microwave radiation tuned over a frequency range. Reflected microwave radiation is detected, the reflected radiation having maxima and minima over the frequency range as a result of coherent interference of microwaves reflected from reflecting surfaces of the material. The thickness of the material is determined from the period of the maxima and minima along with knowledge of the index of refraction of the material.Type: GrantFiled: March 26, 1998Date of Patent: March 6, 2001Assignee: Massachusetts Institute of TechnologyInventors: Paul Woskov, David A. Lamar
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Patent number: 6081329Abstract: A method and portable apparatus for self-powered, sensitive analysis of solid, liquid or gas samples for the presence of elements is provided. The apparatus includes a compact sensor system which utilizes a microwave power source and a shorted waveguide to induce a plasma. The microwave power source may be a magnetron or the like. The device includes a portable power supply and preferably includes a portable battery charger. The portable power supply includes a compact generator-internal combustion engine unit. The device can be operated by directly using power from the portable power supply or in a more compact embodiment by using power from batteries that are recharged by a separate portable power supply module. Pulsed microwave operation can be used to reduce average power requirements and facilitate the use of very compact units using batteries. The device is capable of being transported to and from remote sites for analysis by an individual without the need for heavy transportation equipment.Type: GrantFiled: October 19, 1998Date of Patent: June 27, 2000Inventors: Daniel R. Cohn, Paul Woskov, Charles H. Titus, Jeffrey E. Surma
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Patent number: 5909277Abstract: The apparatus for analyzing a sample gas includes a source of microwave energy directed onto the sample gas to create a plasma. A spectrometer is arranged to receive light from the plasma to identify different elements and/or to determine the concentration of at least one element in the sample gas. In one embodiment, an attached calibration system is provided for calibrating the output of the spectrometer. The calibration system includes a nebulizer apparatus for introducing a controlled amount of at least one element into the sample gas. The apparatus also includes structure adapted to add a swirl component to the plasma gas flow as an aid to plasma confinement. It is also preferred that a pair of electrodes contacting the sample gas be provided for igniting the plasma.Type: GrantFiled: February 13, 1998Date of Patent: June 1, 1999Assignee: Massachusetts Institute of TechnologyInventors: Paul Woskov, Kamal Hadidi, Paul Thomas
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Patent number: 5825485Abstract: A method and portable apparatus for self-powered, sensitive analysis of solid, liquid or gas samples for the presence of elements is provided. The apparatus includes a compact sensor system which utilizes a microwave power source and a shorted waveguide to induce a plasma. The microwave power source may be a magnetron or the like. The device includes a portable power supply and preferably includes a portable battery charger. The portable power supply includes a compact generator- internal combustion engine unit. The device can be operated by directly using power from the portable power supply or in a more compact embodiment by using power from batteries that are recharged by a separate portable power supply module. Pulsed microwave operation can be used to reduce average power requirements and facilitate the use of very compact units using batteries. The device is capable of being transported to and from remote sites for analysis by an individual without the need for heavy transportation equipment.Type: GrantFiled: November 3, 1995Date of Patent: October 20, 1998Inventors: Daniel R. Cohn, Paul Woskov, Charles H. Titus, Jeffrey E. Surma