Abstract: A contactor apparatus used in automatic testing in a manufacturing line includes a site for receiving an electrical device with an array of input/output elements on a surface of the electrical device package. The contactor is capable of forming electrical connections with each of the elements in the array. The contactor has a guide plate including plurality of contact elements. Each contact element has a first end and a second end. The contact elements are positioned in an array which corresponds to the array of input/output elements of the electrical device. The guide plate is attached to a printed circuit having a plurality of pads. The pads are also situated in an array. The printed circuit is an interface to test electronics located near the printed circuit. An anisotropic compliant conductive interposer is positioned between the contact elements of the guide plate and pads of the printed circuit.

Abstract: A contactor receives an electrical component having peripheral leads. The contactor guides the peripherally leaded component into contact with automated testing equipment. Electrical connections are made with the peripheral leads of the electrical component. The contactor includes a number of cantilever spring contacts for contacting the peripheral leads on the component in the peripherally leaded package. Each cantilever spring contact has a first free end which is upturned and contacts the peripheral lead. The cantilever spring contact has a second attached end. The attached end is positioned over and in electrical contact with an anisotropic, conductive interposer which conducts electrical current in two directions along an axis through the interposer. The contactor includes an alignment mechanism for aligning the peripheral leads of the component to corresponding cantilevered spring contacts of the contactor. An interface board also contacts the anisotropic, conductive interposer.